Presentation 2005-05-12
A Reconfigurable Embedded Decompressor for LSI Testing
Tomoyuki SAIKI, Hideyuki ICHIHARA, Tomoo INOUE,
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Abstract(in English) The problem of the increase in test data size for large-scale curcuits has developed. In order to solve this problem, several techniques of decompressing test data compressed using decompressors embedded in an LSI under test have been proposed. In this paper, we propose a model of embedded decompressors that are reconfigurable according to test data, and show example of the decompressor architecture for three coding techniques. Furthermore, the test data compression ratio in the test of SoC cores and the program data size required for reconfiguration are evaluated by our experiments.
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Keyword(in English) Test compression / embedded decompressors / reconfigurability / architecture / encoding / test application time / LSIs
Paper # RECONF2005-1
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Committee RECONF
Conference Date 2005/5/5(1days)
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Registration To Reconfigurable Systems (RECONF)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Reconfigurable Embedded Decompressor for LSI Testing
Sub Title (in English)
Keyword(1) Test compression
Keyword(2) embedded decompressors
Keyword(3) reconfigurability
Keyword(4) architecture
Keyword(5) encoding
Keyword(6) test application time
Keyword(7) LSIs
1st Author's Name Tomoyuki SAIKI
1st Author's Affiliation Graduate School of Information Science, Hiroshima City University()
2nd Author's Name Hideyuki ICHIHARA
2nd Author's Affiliation Faculty of Information Sciences, Hiroshima City University
3rd Author's Name Tomoo INOUE
3rd Author's Affiliation Faculty of Information Sciences, Hiroshima City University
Date 2005-05-12
Paper # RECONF2005-1
Volume (vol) vol.105
Number (no) 42
Page pp.pp.-
#Pages 6
Date of Issue