| Presentation | 2002/7/12 Fabrication of high critical current density YBCO films and investigation of grain boundary junctions Kenichi TAKAHASHI, Yohei KAWAGUCHI, Shinya KURIKI, Toshiya OTOWA, Mizushi MATSUDA, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In order to improve the sensitivity of SQUIDs magnetometers made of high-T_c films, we have studied the conditions of pulsed-laser-deposition of YBCO films. Among different deposition parameters examined, extensive degassing of the vacuum chamber before and precise control of the substrate temperature during the film deposition were found effective to obtain high critical temperature T_c and high critical current density J_c. It was also found that the residual resistance ratio has clear correlation with J_c, indicating that it can be a good, and easy to measure, index of the film quality. Those films having T_c ≈ 89-90 K and J_c≧ 5x10^6 A/cm^2 at 77 K were used to fabricate SQUIDs without pickup loop. Grain boundary junctions formed on bicrystal substrates with 30 -misorientation angle exhibited I_cR_n values of more than 100 μV at 77 K. Well-known scaling behavior of the relation of I_cR_n ∝ (J^ |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | pulsed-laser-deposition / RRR / critical current density / grain boundary junctions / I_cR_n / SQUID / modulation voltages |
| Paper # | SCE2002-18 |
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| Conference Information | |
| Committee | SCE |
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| Conference Date | 2002/7/12(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Superconductive Electronics (SCE) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Fabrication of high critical current density YBCO films and investigation of grain boundary junctions |
| Sub Title (in English) | |
| Keyword(1) | pulsed-laser-deposition |
| Keyword(2) | RRR |
| Keyword(3) | critical current density |
| Keyword(4) | grain boundary junctions |
| Keyword(5) | I_cR_n |
| Keyword(6) | SQUID |
| Keyword(7) | modulation voltages |
| 1st Author's Name | Kenichi TAKAHASHI |
| 1st Author's Affiliation | Research Institute for Electronic Science, Hokkaido University() |
| 2nd Author's Name | Yohei KAWAGUCHI |
| 2nd Author's Affiliation | Research Institute for Electronic Science, Hokkaido University |
| 3rd Author's Name | Shinya KURIKI |
| 3rd Author's Affiliation | Research Institute for Electronic Science, Hokkaido University |
| 4th Author's Name | Toshiya OTOWA |
| 4th Author's Affiliation | Muroran Institute of Technology |
| 5th Author's Name | Mizushi MATSUDA |
| 5th Author's Affiliation | Muroran Institute of Technology |
| Date | 2002/7/12 |
| Paper # | SCE2002-18 |
| Volume (vol) | vol.102 |
| Number (no) | 221 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |