| Presentation | 2002/8/15 Very Low Power System LSI toward 0.1V Operation : Issues and solutions for low power circuit techniques Masayuki MIYAZAKI, Goichi ONO, Takehiro SHIMIZU, Yusuke KANNO, Takayuki KAWAHARA, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Leakage current is growing remarkably in sub-100nm era and it will prevent system LSIs to suppress the powex dissipation. Such leakage current includes the sub-threshold leak and the gate-tunneling leak of MOS transistors. The leakage current will dominate the system LSIs' performance in the near future. Several low-power techniques are evaluated and issues are discussed from the view point of leakage reduction. The LSI design must become complicated when intellectual properties (IPs) are re-used for a highly functional and integrated system-in-a-package chip. Then the low-power techniques are requirec to be simple, unified and generalized. The power switch system corresponding to the IP design is suggested as a generalized technology. The simultaneous supply-voltage and body-bias control is discussed as a technology integration. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Sub-threshold leak / Gate-tunneling leak / Power switch / Body bias control / Supply voltage control |
| Paper # | ICD2002-60 |
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| Conference Information | |
| Committee | ICD |
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| Conference Date | 2002/8/15(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
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| Paper Information | |
| Registration To | Integrated Circuits and Devices (ICD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Very Low Power System LSI toward 0.1V Operation : Issues and solutions for low power circuit techniques |
| Sub Title (in English) | |
| Keyword(1) | Sub-threshold leak |
| Keyword(2) | Gate-tunneling leak |
| Keyword(3) | Power switch |
| Keyword(4) | Body bias control |
| Keyword(5) | Supply voltage control |
| 1st Author's Name | Masayuki MIYAZAKI |
| 1st Author's Affiliation | Hitachi, Ltd. Central Research Laboratory() |
| 2nd Author's Name | Goichi ONO |
| 2nd Author's Affiliation | Hitachi, Ltd. Central Research Laboratory |
| 3rd Author's Name | Takehiro SHIMIZU |
| 3rd Author's Affiliation | Hitachi, Ltd. Central Research Laboratory |
| 4th Author's Name | Yusuke KANNO |
| 4th Author's Affiliation | Hitachi, Ltd. Central Research Laboratory |
| 5th Author's Name | Takayuki KAWAHARA |
| 5th Author's Affiliation | Hitachi, Ltd. Central Research Laboratory |
| Date | 2002/8/15 |
| Paper # | ICD2002-60 |
| Volume (vol) | vol.102 |
| Number (no) | 273 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |