Presentation 2002/8/23
Polarization Charge Densities at p-GaN/n-AlGaN Heterojunctions Evaluated by Capacitance-Voltage Characteristics
Toshiki Makimoto, Kazuhide Kumakura, Naoki Kobayashi,
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Abstract(in English) We propose a new method to evaluate the polarization charge density induced at hetero-interfaces using capacitance-voltage characteristics of p-n heterojunctions and have applied this method to p-GaN/n-AlGaN hetrojunction diodes. Using this method, it is possible to evaluate the negative polarization charge densities for GaN on top of AlGaN heterostructures. Furthermore, this method uses p-n heterojunction structures instead of undoped ones, so the obtained result is less influenced by background impurities or deep levels. The experimental results indicate that the negative polarization charges more than 5x10^<12> cm^<-2> are induced at the GaN/AlGaN hetero-interfaces for the Al mole fractions above 11%.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Polarization charges / Piezoelectric charges / Spontaneous charges / Capacitance-voltage characteristics / Heterojunction / p-GaN/n-AlGaN / Diode
Paper # ED2002-194
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Committee ED
Conference Date 2002/8/23(1days)
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Registration To Electron Devices (ED)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Polarization Charge Densities at p-GaN/n-AlGaN Heterojunctions Evaluated by Capacitance-Voltage Characteristics
Sub Title (in English)
Keyword(1) Polarization charges
Keyword(2) Piezoelectric charges
Keyword(3) Spontaneous charges
Keyword(4) Capacitance-voltage characteristics
Keyword(5) Heterojunction
Keyword(6) p-GaN/n-AlGaN
Keyword(7) Diode
1st Author's Name Toshiki Makimoto
1st Author's Affiliation NTT Basic Research Laboratories, NTT Corporation()
2nd Author's Name Kazuhide Kumakura
2nd Author's Affiliation NTT Basic Research Laboratories, NTT Corporation
3rd Author's Name Naoki Kobayashi
3rd Author's Affiliation NTT Basic Research Laboratories, NTT Corporation
Date 2002/8/23
Paper # ED2002-194
Volume (vol) vol.102
Number (no) 294
Page pp.pp.-
#Pages 6
Date of Issue