Presentation | 2002/8/23 Characterization of electrical properties of micro-Schottky contacts on ELO GaN Keiichiro KUMADA, Tomohiro MURARA, Yutaka OHNO, Shigeru KISHIMOTO, Koichi MAEZAWA, Takashi MIZUTANI, Nobuhiko SAWAKI, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | I-V characteristic of micro-Schottky contacts fabricated on ELO GaN has been measured. The obtained characteristics are classified into two groups; good contacts with small ideality factor and poor ones with large n-value. On the other hand, little scatter are observed in the measurement on n-GaAs. This means that the poor I-V characteristics are not caused by fabrication process or the measurement system. Based on these experiments, it has been concluded that the poor I-V characteristics are due to the crystal defects. The correlation between the poor I-V characteristics and dislocations of GaN has been discussed based on the results of cathode luminescence. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | GaN / dislocation / ELO / micro-Schottky contact / I-V characteristics |
Paper # | ED2002-192 |
Date of Issue |
Conference Information | |
Committee | ED |
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Conference Date | 2002/8/23(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electron Devices (ED) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Characterization of electrical properties of micro-Schottky contacts on ELO GaN |
Sub Title (in English) | |
Keyword(1) | GaN |
Keyword(2) | dislocation |
Keyword(3) | ELO |
Keyword(4) | micro-Schottky contact |
Keyword(5) | I-V characteristics |
1st Author's Name | Keiichiro KUMADA |
1st Author's Affiliation | Department of Quantum Engineering, Nagoya University() |
2nd Author's Name | Tomohiro MURARA |
2nd Author's Affiliation | Department of Quantum Engineering, Nagoya University |
3rd Author's Name | Yutaka OHNO |
3rd Author's Affiliation | Department of Quantum Engineering, Nagoya University |
4th Author's Name | Shigeru KISHIMOTO |
4th Author's Affiliation | Department of Quantum Engineering, Nagoya University |
5th Author's Name | Koichi MAEZAWA |
5th Author's Affiliation | Department of Quantum Engineering, Nagoya University |
6th Author's Name | Takashi MIZUTANI |
6th Author's Affiliation | Department of Quantum Engineering, Nagoya University |
7th Author's Name | Nobuhiko SAWAKI |
7th Author's Affiliation | Department of Quantum Engineering, Nagoya University |
Date | 2002/8/23 |
Paper # | ED2002-192 |
Volume (vol) | vol.102 |
Number (no) | 294 |
Page | pp.pp.- |
#Pages | 5 |
Date of Issue |