Presentation 2002/8/2
Dependence on the RF power of the characteristics of 3C-SiC on Si(001) grown by triode plasma CVD
Kanji YASUI, Masahiro HASHIBA, Tadashi AKAHANE,
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Abstract(in English) Epitaxial growth of 3C-SiC on Si(100) was carried out by triode plasma CVD using dimethylsilane as a source gas. The dependence of the film properties such as crystallinity and the generation of stacking faults on the RF power was investigated. Under low substrate temperatures, the crystallinty and the ratio of the domain including stacking faults of SiC were improved at RF power of 60W. On the other hand, those characteristics detenorated by the application of the RF power at 1100℃.
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Keyword(in English) Triode plasma CVD / 3C-SiC / RF power / Epitaxial growth
Paper # CPM2002-60
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Committee CPM
Conference Date 2002/8/2(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Dependence on the RF power of the characteristics of 3C-SiC on Si(001) grown by triode plasma CVD
Sub Title (in English)
Keyword(1) Triode plasma CVD
Keyword(2) 3C-SiC
Keyword(3) RF power
Keyword(4) Epitaxial growth
1st Author's Name Kanji YASUI
1st Author's Affiliation Department of Electrical Engineering, Nagaoka University of Technology()
2nd Author's Name Masahiro HASHIBA
2nd Author's Affiliation Department of Electrical Engineering, Nagaoka University of Technology
3rd Author's Name Tadashi AKAHANE
3rd Author's Affiliation Department of Electrical Engineering, Nagaoka University of Technology
Date 2002/8/2
Paper # CPM2002-60
Volume (vol) vol.102
Number (no) 261
Page pp.pp.-
#Pages 6
Date of Issue