| Presentation | 2002/8/1 Effect of CeO_2 annealing on the characteristics of R-Al_2O_3＼CeO_2＼EuBa_2Cu_3O_<7-δ> thin films Yoshihiko UENO, Takeo HASHIMOTO, Shinji KIKUCHI, Osamu MICHIKAMI, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | We investigated the effects of annealing for a CeO_2 buffer layer on surface morpology, crystallinity and electrical properties of R-Al_2O_3＼CeO_2＼EuBa_2Cu_3O_<7-δ> thin films. CeO_2 buffer layers 300 Å thick deposited on an R-Al_2O_3 substrate at 650 ℃ by RF magnetron sputtering were annnealed at various temperatures and EuBa_2Cu_3O_<7-δ>(EBCO) thin films were deposited on R-Al_2O_3＼CeO_2 at 670 ℃ by DC magnetron sputtering. The surface roughness of CeO_2 buffer layers were improved at annealing temperatures over 700 ℃. Accordingly, the surface roughness of EBCO thin films deposited on the annealed CeO_2 buffer layers were improved. The critical temperature(T_c) was about 90 K regardless of the annealing conditions for the CeO_2 buffer layer. The J_c's of EBCO thin films deposited on the CeO_2 buffer layer annealed at about 800 ℃ were considerably improved compared with that on an as-grown CeO_2 buffer layer and were about 4.5 × 10^6 A/cm^2. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | CeO_2 / annealing / critical current density |
| Paper # | CPM2002-55 |
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| Committee | CPM |
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| Conference Date | 2002/8/1(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Component Parts and Materials (CPM) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Effect of CeO_2 annealing on the characteristics of R-Al_2O_3＼CeO_2＼EuBa_2Cu_3O_<7-δ> thin films |
| Sub Title (in English) | |
| Keyword(1) | CeO_2 |
| Keyword(2) | annealing |
| Keyword(3) | critical current density |
| 1st Author's Name | Yoshihiko UENO |
| 1st Author's Affiliation | Faculty of Engineering, Iwate University() |
| 2nd Author's Name | Takeo HASHIMOTO |
| 2nd Author's Affiliation | Faculty of Engineering, Iwate University |
| 3rd Author's Name | Shinji KIKUCHI |
| 3rd Author's Affiliation | Faculty of Engineering, Iwate University |
| 4th Author's Name | Osamu MICHIKAMI |
| 4th Author's Affiliation | Faculty of Engineering, Iwate University |
| Date | 2002/8/1 |
| Paper # | CPM2002-55 |
| Volume (vol) | vol.102 |
| Number (no) | 260 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |