Presentation | 2005-12-20 FTA-Product Line Engineering Collaboration Atsushi NODA, Tsuneo NAKANISHI, Akira FUKUDA, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | In product line software engineering, the developers recognize functional and non-functional features of the product members of a product line, analyze commonality and variability of the product members in terms of their equipping features, and construct or acquire core assets with consideration of reusability. The method proposed in this paper improves reusability of exception handling that are considerable parts of products. The proposed method exploits exception handling features with using fault tree analysis (or FTA), reflects the exploited features in the feature diagram, and handles core assets relating to the exploited features. The proposed method reduces omission of exception handling, moreover, manages the constructed fault tree as a core asset and enables derivation of fault trees of product members of the product line to use them for software test. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | fault tree analysis (FTA) / product line software engineering / feature diagram / exception handling / reuse |
Paper # | SS2005-66 |
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Committee | SS |
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Conference Date | 2005/12/13(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Software Science (SS) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | FTA-Product Line Engineering Collaboration |
Sub Title (in English) | |
Keyword(1) | fault tree analysis (FTA) |
Keyword(2) | product line software engineering |
Keyword(3) | feature diagram |
Keyword(4) | exception handling |
Keyword(5) | reuse |
1st Author's Name | Atsushi NODA |
1st Author's Affiliation | Graduate School of Information Science and Electrical Engineering, Kyushu University() |
2nd Author's Name | Tsuneo NAKANISHI |
2nd Author's Affiliation | Faculty of Information Science and Electrical Engineering, Kyushu University |
3rd Author's Name | Akira FUKUDA |
3rd Author's Affiliation | Faculty of Information Science and Electrical Engineering, Kyushu University |
Date | 2005-12-20 |
Paper # | SS2005-66 |
Volume (vol) | vol.105 |
Number (no) | 491 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |