| Presentation | 2005-12-09 Complex permittivity measurement by using rectangular cavity resonator based on S-parameter analysis Tomohiro OGIWARA, Masaki KOUZAI, Atsuhiro NISHIKATA, Kaori FUKUNAGA, Yukio YAMANAKA, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | The dielectric tube method, which we have proposed, is also applicable to the complex permittivity measurement of dielectric materials. The method that inserts the specimen like a cylindrical or a multilayer cylinder, from the larger side of the rectangular waveguide, and measures complex permittivity with swept frequency by S-parameter is named as the cylindrical specimen inserted rectangular waveguide method. This method cannot accurately measure the dielectric loss factor of the low loss material. In this report, we measured by adding two coupling window plate to the device of this method to compose the rectangular cavity resonator to be able to measure the low loss material, and aiming measuring about three points in the waveguide frequency band. We call this method the cylindrical specimen inserted rectangular cavity resonator method. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Cavity resonator method / low loss material / complex permittivity / S-parameter |
| Paper # | EMCJ2005-126 |
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| Conference Information | |
| Committee | EMCJ |
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| Conference Date | 2005/12/2(1days) |
| Place (in Japanese) | (See Japanese page) |
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| Topics (in Japanese) | (See Japanese page) |
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| Registration To | Electromagnetic Compatibility (EMCJ) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Complex permittivity measurement by using rectangular cavity resonator based on S-parameter analysis |
| Sub Title (in English) | |
| Keyword(1) | Cavity resonator method |
| Keyword(2) | low loss material |
| Keyword(3) | complex permittivity |
| Keyword(4) | S-parameter |
| 1st Author's Name | Tomohiro OGIWARA |
| 1st Author's Affiliation | CRADLE, Tokyo Institute of Technology() |
| 2nd Author's Name | Masaki KOUZAI |
| 2nd Author's Affiliation | CRADLE, Tokyo Institute of Technology |
| 3rd Author's Name | Atsuhiro NISHIKATA |
| 3rd Author's Affiliation | CRADLE, Tokyo Institute of Technology:National Institute of Information and Communications Technology |
| 4th Author's Name | Kaori FUKUNAGA |
| 4th Author's Affiliation | National Institute of Information and Communications Technology |
| 5th Author's Name | Yukio YAMANAKA |
| 5th Author's Affiliation | National Institute of Information and Communications Technology |
| Date | 2005-12-09 |
| Paper # | EMCJ2005-126 |
| Volume (vol) | vol.105 |
| Number (no) | 454 |
| Page | pp.pp.- |
| #Pages | 4 |
| Date of Issue | |