Presentation 1999/12/17
A high speed 3D measurement technique using the phase sift method
Takeshi DENDA, Takeshi OHASHI, Toshiaki EJIMA,
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Abstract(in English) As progressing the computer processing ability, it is hoped for the high speed and the high accurate 3D shape measurement method, using 3D shape modeling in the various field. The sinusoidal grating projection with the phase shift method can measure 3D shape every pixel by the lowest three images and can get a texture image with the high speed and accuracy at the same time. However, the phase unwrapping was a problem to be solved in the measurement absolute distance. In this paper, using the sinusoidal grating patterns that are combination of some spacial frequencies, we propose the technique that finds the absolute phase. We show the experimental result using the proposed technique and consider the appropriateness by the technique.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) 3D measurement / renge finder / phase sift method / sinusoidal grating projection
Paper # PRMU99-183
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Conference Information
Committee PRMU
Conference Date 1999/12/17(1days)
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Registration To Pattern Recognition and Media Understanding (PRMU)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A high speed 3D measurement technique using the phase sift method
Sub Title (in English)
Keyword(1) 3D measurement
Keyword(2) renge finder
Keyword(3) phase sift method
Keyword(4) sinusoidal grating projection
1st Author's Name Takeshi DENDA
1st Author's Affiliation Faculty of Computer Science and Systems Engineering Kyushu Institute of Technology()
2nd Author's Name Takeshi OHASHI
2nd Author's Affiliation Faculty of Computer Science and Systems Engineering Kyushu Institute of Technology
3rd Author's Name Toshiaki EJIMA
3rd Author's Affiliation Faculty of Computer Science and Systems Engineering Kyushu Institute of Technology
Date 1999/12/17
Paper # PRMU99-183
Volume (vol) vol.99
Number (no) 515
Page pp.pp.-
#Pages 8
Date of Issue