| Presentation | 2000/2/18 Endurance Test Methods for Contactless IC Cards Nobuhiro Shimoyama, Hiroshi Ban, Tadao Takeda, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | This paper presents methods of endurance test for contactless IC cards. Assuming both the normal and incidental use of IC card, we propose four tests methods, those are bending and pressure, spot pressure, alternate bending, and impact. For spot pressure and impact tests, some testing conditions are determined based on the measured data. Using these test methods, we examined endurance for both a contact IC card and a contactless one. As IC chip for contactless IC card is covered with card material only, such as PVC or PET, the influence of an external stress on endurance of IC chip is serious problem. To solve this problem, we indicated that a use of reinforcement under IC chip improves endurance of IC chip for contactless IC card. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | IC card / endurance / test methods / contactless / stress / spot pressure / impact |
| Paper # | R99-37, EMD99-87 |
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| Conference Information | |
| Committee | EMD |
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| Conference Date | 2000/2/18(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Vice Chair | |
| Secretary | |
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| Paper Information | |
| Registration To | Electromechanical Devices (EMD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Endurance Test Methods for Contactless IC Cards |
| Sub Title (in English) | |
| Keyword(1) | IC card |
| Keyword(2) | endurance |
| Keyword(3) | test methods |
| Keyword(4) | contactless |
| Keyword(5) | stress |
| Keyword(6) | spot pressure |
| Keyword(7) | impact |
| 1st Author's Name | Nobuhiro Shimoyama |
| 1st Author's Affiliation | NTT Lifestyle and Environmental Technology Laboratories() |
| 2nd Author's Name | Hiroshi Ban |
| 2nd Author's Affiliation | NTT Lifestyle and Environmental Technology Laboratories |
| 3rd Author's Name | Tadao Takeda |
| 3rd Author's Affiliation | NTT Lifestyle and Environmental Technology Laboratories |
| Date | 2000/2/18 |
| Paper # | R99-37, EMD99-87 |
| Volume (vol) | vol.99 |
| Number (no) | 644 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |