Presentation | 1999/10/21 Multistage Structure of Randomized ANNs and Its Reliability Prediction Model Eiji SUZUKI, Tohru NAKAGAWA, Hajime KITAGAWA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | In case that an input pattern is unexpected one, namely, it completely differs from that of the training set, the reliability of an ANN (Artificial Neural Network) pattern classifier is very low. The reliability can be improved by a multistage structure of randomized ANNs, in which multiple ANNs are combined in serial and parallel ways. The ANNs have different initial conditions for learning each other. In this paper, we propose a novel model for predicting the reliability of the combined multiple ANN pattern classifier. We also evaluate the model by an experiment on a pattern classification of SIN waves, and find that our model predicts the reliability well especially when the ANNs are combined in parallel way. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Randomized ANN / Multistage / Reliability / Prediction Model / Pattern Classification |
Paper # | NC99-45 |
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Committee | NC |
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Conference Date | 1999/10/21(1days) |
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Paper Information | |
Registration To | Neurocomputing (NC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Multistage Structure of Randomized ANNs and Its Reliability Prediction Model |
Sub Title (in English) | |
Keyword(1) | Randomized ANN |
Keyword(2) | Multistage |
Keyword(3) | Reliability |
Keyword(4) | Prediction Model |
Keyword(5) | Pattern Classification |
1st Author's Name | Eiji SUZUKI |
1st Author's Affiliation | Toyota Technological Institute() |
2nd Author's Name | Tohru NAKAGAWA |
2nd Author's Affiliation | Toyota Technological Institute |
3rd Author's Name | Hajime KITAGAWA |
3rd Author's Affiliation | Toyota Technological Institute |
Date | 1999/10/21 |
Paper # | NC99-45 |
Volume (vol) | vol.99 |
Number (no) | 382 |
Page | pp.pp.- |
#Pages | 8 |
Date of Issue |