Presentation | 1999/10/22 Applicability of aluminate phosphors with β-tridymite structure for color plasma display panels Ikuo Ozaki, Kazuaki Okamoto, Takashi Kunimoto, Kotoku Ohmi, Shosaku Tanaka, Hiroshi Kobayashi, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Blue PDP phosphor BaMgAl_<10>O_<17>:Eu^<2+> (BAM:Eu^<2+> with β-alumina structure shows the luminance degradation at the panel production and panel operation due to the oxidation of activator and defect-generation in a host crystal. To prevent this luminance degradation, phosphor characteristics of a blue phosphor CaAl_2O_4:Eu^<2+> (CA:Eu^<2+>) with β -tridymite structure were investigated.. The photoluminescence (PL) intensity of CAEu^<2+> (1 % Eu content) prepared by the two-step firing synthesis is about 50% of that of BAM:Eu^<2+> under 147 nm excited light. By baking the phosphors in air at 600 ℃, the PL luminance is decreased to 88 % for CA:Eu^<2+> and to 79 % for BAM:Eu^<2+>. The testing panel using CA:Eu^<2+> phosphor shows the same spectrum of powder phosphor. However the luminance of testing panel with CA:Eu^<2+> is still 35 % of that with commercial BAM;Eu^<2+> phosphor. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | CaAl_2O_4:Eu^<2+> / BaMgAl_<10>O_<17>:Eu^<2+> / β-tridymite structure / PDP / Luminance degradation / Thermal stability |
Paper # | EID99-63 |
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Conference Information | |
Committee | EID |
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Conference Date | 1999/10/22(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electronic Information Displays (EID) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Applicability of aluminate phosphors with β-tridymite structure for color plasma display panels |
Sub Title (in English) | |
Keyword(1) | CaAl_2O_4:Eu^<2+> |
Keyword(2) | BaMgAl_<10>O_<17>:Eu^<2+> |
Keyword(3) | β-tridymite structure |
Keyword(4) | PDP |
Keyword(5) | Luminance degradation |
Keyword(6) | Thermal stability |
1st Author's Name | Ikuo Ozaki |
1st Author's Affiliation | Department of Electrical and Electronic Engineering Tottori University() |
2nd Author's Name | Kazuaki Okamoto |
2nd Author's Affiliation | Department of Electrical and Electronic Engineering Tottori University |
3rd Author's Name | Takashi Kunimoto |
3rd Author's Affiliation | Department of Electrical and Electronic Engineering Tottori University |
4th Author's Name | Kotoku Ohmi |
4th Author's Affiliation | Department of Electrical and Electronic Engineering Tottori University |
5th Author's Name | Shosaku Tanaka |
5th Author's Affiliation | Department of Electrical and Electronic Engineering Tottori University |
6th Author's Name | Hiroshi Kobayashi |
6th Author's Affiliation | Department of Electrical and Electronic Engineering Tottori University |
Date | 1999/10/22 |
Paper # | EID99-63 |
Volume (vol) | vol.99 |
Number (no) | 375 |
Page | pp.pp.- |
#Pages | 4 |
Date of Issue |