Presentation | 1999/10/22 Aging properties of conductive coating phosphors under middle energy electron excitation H. Kominami, M. Kottaisamy, T. Aoki, N. Azuma, T. Nakamura, Y. Nakanishi, Y. Hatanaka, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Cathodoluminescent properties, especially, aging-properties of CRT phosphors coated with In_2O_3 by sol-gel method were investigated at anode voltage of several kV. The aging properties greatly depend on the vacuum pressure in the chamber, electron beam density and anode voltage. The coating of phosphor by sol-gel method was effective for luminance deterioration at middle energy electron excitation. It seems that the In_2O_3 thin layer suppress not only the interaction of phosphor surface with remained gasses in the chamber but also migration of host atoms to the surface. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | FED / Middle energy electron excitation / ZnS:Ag,Cl / Sol-gel method / In_2O_3 coating layer, |
Paper # | EID99-57 |
Date of Issue |
Conference Information | |
Committee | EID |
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Conference Date | 1999/10/22(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electronic Information Displays (EID) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Aging properties of conductive coating phosphors under middle energy electron excitation |
Sub Title (in English) | |
Keyword(1) | FED |
Keyword(2) | Middle energy electron excitation |
Keyword(3) | ZnS:Ag,Cl |
Keyword(4) | Sol-gel method |
Keyword(5) | In_2O_3 coating layer, |
1st Author's Name | H. Kominami |
1st Author's Affiliation | Graduate School of Electronic Science and Technology, Shizuoka University() |
2nd Author's Name | M. Kottaisamy |
2nd Author's Affiliation | Research Institute of Electronics, Shizuoka University |
3rd Author's Name | T. Aoki |
3rd Author's Affiliation | Research Institute of Electronics, Shizuoka University |
4th Author's Name | N. Azuma |
4th Author's Affiliation | Faculty of Engineering, Shizuoka University |
5th Author's Name | T. Nakamura |
5th Author's Affiliation | Faculty of Engineering, Shizuoka University |
6th Author's Name | Y. Nakanishi |
6th Author's Affiliation | Graduate School of Electronic Science and Technology, Shizuoka University:Research Institute of Electronics, Shizuoka University |
7th Author's Name | Y. Hatanaka |
7th Author's Affiliation | Graduate School of Electronic Science and Technology, Shizuoka University:Research Institute of Electronics, Shizuoka University |
Date | 1999/10/22 |
Paper # | EID99-57 |
Volume (vol) | vol.99 |
Number (no) | 375 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |