| Presentation | 1999/10/22 Optical Simulation of Inverted Structure Thin-Film Electroluminescent Devices by Fresnel Analysis : Rear Electrode Materials Akiyoshi Mikami, Takahiro Ishikawa, Naoki Yamamura, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In order to develop an optical analysis tool for multi-layer thin-film structure including an self-emitting layer, we have propose an four-division analytical model combined with multiple reflection of internal emission and the calculation of characteristic matrix in passive thin-film stack. The model is applied to the yellow and white light emitting electroluminescent (EL) devices with broad-band phosphors of ZnS:Mn and SrS:Ce, especially to the investigation of the relationship between the luminescence properties (luminance, color characteristics, efficiency and contrast ratio) and the reflection characteristics of rear electrode material. The experimental results show that the luminance is unexpectedly reduced down to less than one third of the original intensity by replacing the rear electrode with lower reflectance materials. Optical redesign will be almost inevitable for optimizing the inverted structure with low reflective electrode. It is further clarified that the viewing angle behavior deteriorates with increasing the reflection of the rear electrode, and the key material to determine the visual quality of the display is not a blue phosphor but a red one. A theoretical model has been investigated with the ability to simulate the contrast ratio by deriving the outcoupling efficiency and the feature of panel reflection in the visible region. The contrast ratio is rapidly improved in the range less than 0.2 in terms of the internal reflection of rear multi-layers. In particular, the ITO electrode is supposed to exhibit an excellent display quality among the low reflective materials, which is considered very important advantage for the outdoor application. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Electroluminescence / Optical simulation / Multiple interference / Fresnel coefficient / Phosphor |
| Paper # | EID99-55 |
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| Conference Information | |
| Committee | EID |
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| Conference Date | 1999/10/22(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Registration To | Electronic Information Displays (EID) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Optical Simulation of Inverted Structure Thin-Film Electroluminescent Devices by Fresnel Analysis : Rear Electrode Materials |
| Sub Title (in English) | |
| Keyword(1) | Electroluminescence |
| Keyword(2) | Optical simulation |
| Keyword(3) | Multiple interference |
| Keyword(4) | Fresnel coefficient |
| Keyword(5) | Phosphor |
| 1st Author's Name | Akiyoshi Mikami |
| 1st Author's Affiliation | Kanazawa Institute of Technology Advanced Optical Electro Magnetic Field Science Lab.() |
| 2nd Author's Name | Takahiro Ishikawa |
| 2nd Author's Affiliation | Kanazawa Institute of Technology Advanced Optical Electro Magnetic Field Science Lab. |
| 3rd Author's Name | Naoki Yamamura |
| 3rd Author's Affiliation | Kanazawa Institute of Technology Advanced Optical Electro Magnetic Field Science Lab. |
| Date | 1999/10/22 |
| Paper # | EID99-55 |
| Volume (vol) | vol.99 |
| Number (no) | 375 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |