| Presentation | 1999/12/2 EMC Analysis of Ultra-low Voltage CMOS circuits with EO High-impedance Probe. : Demonstration of EM field immune Sub-1V MTCMOS/SIMOX Circuits T. Shimamura, T. Douseki, M. Shinagawa, J. Yamada, |
|---|---|
| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | The increase of LSI operation speeds makes EMC (Electro-Magnetic Compatibility) problems (EM field emission and immunity) serious in electronic equipment. Since the emission from LSIs is normally dominated by power supply current, lowering power supply voltage is the most effective way to reduce it. That is, the ultra-low voltage circuits with EM field immunity design can overcome EMC problems. In this paper, we show the EMC performance of sub-1V multi-threshold CMOS/SIMOX (MTCMOS/SIMOX) circuits that we have proposed. From an EMC analysis with an EO high-impedance probe, we clarify the mechanism of LSI failure. We also demonstrate EM field immunity of MTCMOS circuits. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | EMC / ultra-low voltage / multi-threshold CMOS (MTCMOS) circuit / EO highimpedance probe |
| Paper # | ICD99-223 |
| Date of Issue |
| Conference Information | |
| Committee | ICD |
|---|---|
| Conference Date | 1999/12/2(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Integrated Circuits and Devices (ICD) |
|---|---|
| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | EMC Analysis of Ultra-low Voltage CMOS circuits with EO High-impedance Probe. : Demonstration of EM field immune Sub-1V MTCMOS/SIMOX Circuits |
| Sub Title (in English) | |
| Keyword(1) | EMC |
| Keyword(2) | ultra-low voltage |
| Keyword(3) | multi-threshold CMOS (MTCMOS) circuit |
| Keyword(4) | EO highimpedance probe |
| 1st Author's Name | T. Shimamura |
| 1st Author's Affiliation | NTT Telecommunications Energy Laboratories() |
| 2nd Author's Name | T. Douseki |
| 2nd Author's Affiliation | NTT Telecommunications Energy Laboratories |
| 3rd Author's Name | M. Shinagawa |
| 3rd Author's Affiliation | NTT Telecommunications Energy Laboratories |
| 4th Author's Name | J. Yamada |
| 4th Author's Affiliation | NTT Telecommunications Energy Laboratories |
| Date | 1999/12/2 |
| Paper # | ICD99-223 |
| Volume (vol) | vol.99 |
| Number (no) | 485 |
| Page | pp.pp.- |
| #Pages | 7 |
| Date of Issue | |