Presentation | 1999/11/26 A proposal to reduce design TAT for high speed ULSI using improved timing accuracy on timing simulator Hiroshi Kawamoto, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Due to the progress of device technology, deep sub-micron process enables not only to increase density but also to increase the internal clock frequencies year by year. As the clock speed increases, timing accuracy of timing simulation does not fit to the actual device operation timing. This mismatch causes long development period of the high speed ULSI. Currently, E-Beam Prober is considered merely as a failure analysis tool. This E-beam prober is used for measuring the internal node for comparing the actual timing with timing simulator. By comparing both simulation timing and actual timing of E-Beam, the difference is used for improving timing accuracy of simulation. By applying this methodology to the development of high speed Memory, the development period is reduced dramatically. This paper describes about the importance of improved timing simulator for high speed devices design. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | high speed device / timing simulation / operation verification / design Turn Around Time |
Paper # | ICD99-200 |
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Conference Information | |
Committee | ICD |
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Conference Date | 1999/11/26(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
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Paper Information | |
Registration To | Integrated Circuits and Devices (ICD) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A proposal to reduce design TAT for high speed ULSI using improved timing accuracy on timing simulator |
Sub Title (in English) | |
Keyword(1) | high speed device |
Keyword(2) | timing simulation |
Keyword(3) | operation verification |
Keyword(4) | design Turn Around Time |
1st Author's Name | Hiroshi Kawamoto |
1st Author's Affiliation | EBT SE Section 1^ |
Date | 1999/11/26 |
Paper # | ICD99-200 |
Volume (vol) | vol.99 |
Number (no) | 476 |
Page | pp.pp.- |
#Pages | 8 |
Date of Issue |