Presentation 1999/9/28
Boron Doped Silicon Epitaxial Growth Using a Low-Energy Ion Bombardment Process
Satoshi Hondo, Hajime Kumami, Wataru Shindo, Tadahiro Ohmi,
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Abstract(in English) Boron-doped silicon epitaxy using a low-energy ion bombardment process(<30eV) has been investigated. When an ion bombardment energy become greater than 5eV, carrier concentration decreased drastically. Compared with 13eV ion energy of phosphorus-doped Silicon film, this is extremely small energy. Therefore, an ion bombardment energy should be lower than 5eV in order to make carrier concentration in a boron-doped silicon film 100%. This result will give us a right direction for a semiconductor manufacturing employing a ion bombardment process.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) silicon / boron / ion energy / epitaxial growth / deactivation
Paper # SDM99-148
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Conference Information
Committee SDM
Conference Date 1999/9/28(1days)
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Registration To Silicon Device and Materials (SDM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Boron Doped Silicon Epitaxial Growth Using a Low-Energy Ion Bombardment Process
Sub Title (in English)
Keyword(1) silicon
Keyword(2) boron
Keyword(3) ion energy
Keyword(4) epitaxial growth
Keyword(5) deactivation
1st Author's Name Satoshi Hondo
1st Author's Affiliation Department of Electronic Engineering, Graduate School of Engineering, Tohoku University()
2nd Author's Name Hajime Kumami
2nd Author's Affiliation Department of Electronic Engineering, Graduate School of Engineering, Tohoku University
3rd Author's Name Wataru Shindo
3rd Author's Affiliation Department of Electronic Engineering, Graduate School of Engineering, Tohoku University
4th Author's Name Tadahiro Ohmi
4th Author's Affiliation New Industry Creation Hatchery Center, Tohoku University
Date 1999/9/28
Paper # SDM99-148
Volume (vol) vol.99
Number (no) 340
Page pp.pp.-
#Pages 5
Date of Issue