Presentation 1999/9/27
Atomic-layer adsorption of P on Si(100) and Ge(100) by PH_3 using an ultraclean LPCVD
Yosuke SHIMAMUNE, Masao SAKURABA, Takashi MATSUURA, Junichi MUROTA,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Atomic-layer adsorption of P on Si(100) and Ge(100) at 200-750℃ by PH_3 was investigated using an ultraclean low-pressure chemical vapor deposition system. At 300℃, the PH_3 adsorption was suppressed on the H-terminated Si surface, but PH_3 was adsorbed dissociatively on the H-free Si surface with saturation tendency to sub atomic-layer. At 450-750℃, the P atom concentration on the Si surface tended to saturate to about two or three atomic-layers by exposing PH_3 with little influence of the carrier gas (H_2 or He). When the P-adsorbed Si was kept in Ar and in H_2 at 650℃ after PH_3 exposure, the P atom concentration decreased to about one atomic-layer by thermal desorption and also by reduction due to hydrogen. On the Ge surface, PH_3 adsorption was suppressed by H-termination at 200℃, P atom concentration saturated to the single atomic-layer at 300-450℃. Furthermore, P desorption from the Ge surface at 450℃ occurred much faster than that from the Si surface at 650℃, while P bonded to Ge was stable at 300℃.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) PH_3 / surface adsorption / Si(100) / Ge(100) / CVD
Paper # SDM99-141
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Conference Information
Committee SDM
Conference Date 1999/9/27(1days)
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Registration To Silicon Device and Materials (SDM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Atomic-layer adsorption of P on Si(100) and Ge(100) by PH_3 using an ultraclean LPCVD
Sub Title (in English)
Keyword(1) PH_3
Keyword(2) surface adsorption
Keyword(3) Si(100)
Keyword(4) Ge(100)
Keyword(5) CVD
1st Author's Name Yosuke SHIMAMUNE
1st Author's Affiliation Laboratory for Electronic Intelligent Systems, Research Institute of Electrical Communication, Tohoku University.()
2nd Author's Name Masao SAKURABA
2nd Author's Affiliation Laboratory for Electronic Intelligent Systems, Research Institute of Electrical Communication, Tohoku University.
3rd Author's Name Takashi MATSUURA
3rd Author's Affiliation Laboratory for Electronic Intelligent Systems, Research Institute of Electrical Communication, Tohoku University.
4th Author's Name Junichi MUROTA
4th Author's Affiliation Laboratory for Electronic Intelligent Systems, Research Institute of Electrical Communication, Tohoku University.
Date 1999/9/27
Paper # SDM99-141
Volume (vol) vol.99
Number (no) 339
Page pp.pp.-
#Pages 6
Date of Issue