Presentation 1999/9/27
Initial Reaction in Low-Temperature Selective Growth of W on the Si Surface Using WF_6 and SiH_4 Gases
Yuji Yamamoto, Takashi Matsuura, Junichi Murota,
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Abstract(in English) Selective growth of W on the Si(100) surface at ∼100℃ in a WF_6 and SiH_4 mixture was investigated using a cold-wall low-pressure CVD system. It is found that W grows by preheating the wet-cleaned substrate before the growth and the incubation period of the film growth becomes shorter on the Si surface of a lower hydrogen concentration. W nucleus formation before the film growth is also enhanced and the nuclei on the Si surface of a lower hydrogen concentration are of a higher density and a smaller size. Even before the nucleus formation, the W atom is adsorbed and the adsorption rate on the Si surface of a lower hydrogen-termination is higher than that of a higher one. Consequently, hydrogen desorption from the Si surface enhances the W atom adsorption, and after adsorption of a certain concentration of W atoms, the W nucleus formation and growth start.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) CVD / W / Selective Growth / WF_6 / SiH_4 / Incubation Period
Paper # SDM99-140
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Conference Information
Committee SDM
Conference Date 1999/9/27(1days)
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Registration To Silicon Device and Materials (SDM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Initial Reaction in Low-Temperature Selective Growth of W on the Si Surface Using WF_6 and SiH_4 Gases
Sub Title (in English)
Keyword(1) CVD
Keyword(2) W
Keyword(3) Selective Growth
Keyword(4) WF_6
Keyword(5) SiH_4
Keyword(6) Incubation Period
1st Author's Name Yuji Yamamoto
1st Author's Affiliation Laboratory for Electronic Intelligent Systems, Research Institute of Electrical Communication, Tohoku University()
2nd Author's Name Takashi Matsuura
2nd Author's Affiliation Laboratory for Electronic Intelligent Systems, Research Institute of Electrical Communication, Tohoku University
3rd Author's Name Junichi Murota
3rd Author's Affiliation Laboratory for Electronic Intelligent Systems, Research Institute of Electrical Communication, Tohoku University
Date 1999/9/27
Paper # SDM99-140
Volume (vol) vol.99
Number (no) 339
Page pp.pp.-
#Pages 5
Date of Issue