| Presentation | 1999/12/22 A New Model of LSI at Power Supply Terminal for EMI Simulation Masashi OGAWA, Hiroshi WABUKA, Hirokazu TOHYA, |
|---|---|
| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | A radio frequency (RF) current passing from power supply terminals into ground terminals in a LSI on a printed circuit board (PCB) is one of the main factor at electricmagnetic interface (EMI) from cicuit system, then it is important to simulate for EMI to use an appropriate model for LSI. In this report, a new LSI model by simplifying all network data of internal LSI circuit is proposed, which is composed of transistors and load capacitors, and the simulated values of current spectra in the power supply line of a PCB using the proposed model agreed well with the measured values. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | LSI model at power supply terminal / simulation / LSI internal capacitor |
| Paper # | EMCJ99-103 |
| Date of Issue |
| Conference Information | |
| Committee | EMCJ |
|---|---|
| Conference Date | 1999/12/22(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Electromagnetic Compatibility (EMCJ) |
|---|---|
| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A New Model of LSI at Power Supply Terminal for EMI Simulation |
| Sub Title (in English) | |
| Keyword(1) | LSI model at power supply terminal |
| Keyword(2) | simulation |
| Keyword(3) | LSI internal capacitor |
| 1st Author's Name | Masashi OGAWA |
| 1st Author's Affiliation | EMC Engineering Center, Device Analysis Technology Labs, NEC Corporation() |
| 2nd Author's Name | Hiroshi WABUKA |
| 2nd Author's Affiliation | EMC Engineering Center, Device Analysis Technology Labs, NEC Corporation |
| 3rd Author's Name | Hirokazu TOHYA |
| 3rd Author's Affiliation | EMC Engineering Center, Device Analysis Technology Labs, NEC Corporation |
| Date | 1999/12/22 |
| Paper # | EMCJ99-103 |
| Volume (vol) | vol.99 |
| Number (no) | 528 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |