Presentation 1999/9/21
Structural Characterization of Inorganic and Organic Thin Films by Energy Dispersive Grazing Incidence X-ray Analysis
K. Ishida, T. Horiuchi, K. Matsushige,
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Abstract(in English) The characterization of surface and thin films is one of the important fields in the research and development of functional materials. Recently, we proposed an energy dispersive-grazing incidence x-ray analysis system for surface and thin film studies. In this system, the grazing incidence x-ray diffraction, fluorescence spectroscopy and reflectivity measurement can be carried out with a fixed 20 angle. To demonstrate it's capabilities for the structural and orientational characterization of thin films, inorganic and organic thin films evaporated on single crystals were investigated by this system.
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Keyword(in English) Surface Diffraction / Total Reflection / Energy Dispersive / Epitaxial growth / polysilane
Paper # ED99-185
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Committee ED
Conference Date 1999/9/21(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Structural Characterization of Inorganic and Organic Thin Films by Energy Dispersive Grazing Incidence X-ray Analysis
Sub Title (in English)
Keyword(1) Surface Diffraction
Keyword(2) Total Reflection
Keyword(3) Energy Dispersive
Keyword(4) Epitaxial growth
Keyword(5) polysilane
1st Author's Name K. Ishida
1st Author's Affiliation Department of Electronic Science and Engineering, Graduate School of Engineering, Kyoto University()
2nd Author's Name T. Horiuchi
2nd Author's Affiliation Department of Electronic Science and Engineering, Graduate School of Engineering, Kyoto University
3rd Author's Name K. Matsushige
3rd Author's Affiliation Department of Electronic Science and Engineering, Graduate School of Engineering, Kyoto University
Date 1999/9/21
Paper # ED99-185
Volume (vol) vol.99
Number (no) 318
Page pp.pp.-
#Pages 6
Date of Issue