Presentation 1999/12/2
Measurement of High-Speed Signals in Printed Circuit Boards using an Electro-Optic Handy Probe
Mitsuru Shinagawa, Tadao Nagatsuma,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) This paper describes an electro-optic (EO) handy probe for measuring high-speed signals in printed circuit boards (PCB's). The probe offers several unique features: 10-GHz bandwidth, ground-contactless measurement, ultrahigh input impedance (> 100 MΩ and < 0.2 pF), and no damage from electrostatic discharge. The probe has been successfully applied to waveform measurement of Gigabit per second digital IC on PCB, and eye diagrams at 1 Gbps. In addition, we demonstrate the measurement of resonance frequency of a loop antenna in contactless IC cards, and electric near field distribution radiated from a two-layer board. The results show that the probe system is a potential candidate for EMC/EMI instruments.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) electro-optic effect / high-impedance probe / printed circuit boards / eyediagrams / contactless IC cards / ground bounce
Paper # CPM99-126
Date of Issue

Conference Information
Committee CPM
Conference Date 1999/12/2(1days)
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Paper Information
Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Measurement of High-Speed Signals in Printed Circuit Boards using an Electro-Optic Handy Probe
Sub Title (in English)
Keyword(1) electro-optic effect
Keyword(2) high-impedance probe
Keyword(3) printed circuit boards
Keyword(4) eyediagrams
Keyword(5) contactless IC cards
Keyword(6) ground bounce
1st Author's Name Mitsuru Shinagawa
1st Author's Affiliation NTT Telecommunications Energy Laboratories()
2nd Author's Name Tadao Nagatsuma
2nd Author's Affiliation NTT Telecommunications Energy Laboratories
Date 1999/12/2
Paper # CPM99-126
Volume (vol) vol.99
Number (no) 483
Page pp.pp.-
#Pages 8
Date of Issue