Presentation	1999/10/29 Vortex Dynamics of YBa_2Cu_3O_<7-δ> Thin Film Grain Boundary Junctions S. Hirano, H. Oyama, M. Matsuda, T. Morooka, S. Nakayama, S. Kuriki,
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Abstract(in English)	In order to study the vortex dynamics in high-Tc superconducting thin film devices, we investigated the flux noise by the direct flux detection method of YBa_2Cu_3O_<7-δ> (YBCO) grain boundary junctions (misorientation angle 30°, thickness 200 nm, width 84 μm). The flux noise characteristic was sensitive to the history of the cooling process of the sample. At about 81 K, random telegraph noise (RTN) of long time width was observed in several current regions. Zero field cooled and field cooled sample gave different I-Φ_ structures caused by the RTN, suggesting that the RTN of long time width was generated in surrounding weak links. Also, high frequency pulse trains appeared at a current slightly below dc voltage onset and disappeared as the current was increased. The high frequency pulse trains may be related to the transition to the voltage state of the current-biased grain boundary.
Keyword(in Japanese)	(See Japanese page)
Keyword(in English)	Direct flux detection method / YBa_2Cu_3O_<7-δ>(YBCO) grain boundary junction / zero field cool / field cool / random telegraph noise / surrounding weak links
Paper #	SCE99-21
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Conference Information
Committee	SCE
Conference Date	1999/10/29(1days)
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Registration To	Superconductive Electronics (SCE)
Language	JPN
Title (in Japanese)	(See Japanese page)
Sub Title (in Japanese)	(See Japanese page)
Title (in English)	Vortex Dynamics of YBa_2Cu_3O_<7-δ> Thin Film Grain Boundary Junctions
Sub Title (in English)
Keyword(1)	Direct flux detection method
Keyword(2)	YBa_2Cu_3O_<7-δ>(YBCO) grain boundary junction
Keyword(3)	zero field cool
Keyword(4)	field cool
Keyword(5)	random telegraph noise
Keyword(6)	surrounding weak links
1st Author's Name	S. Hirano
1st Author's Affiliation	Research Institute for Electronic Science, Hokkaido University()
2nd Author's Name	H. Oyama
2nd Author's Affiliation	Research Institute for Electronic Science, Hokkaido University
3rd Author's Name	M. Matsuda
3rd Author's Affiliation	Muroran Institute of Technology
4th Author's Name	T. Morooka
4th Author's Affiliation	Seiko Instruments Inc.
5th Author's Name	S. Nakayama
5th Author's Affiliation	Seiko Instruments Inc.
6th Author's Name	S. Kuriki
6th Author's Affiliation	Research Institute for Electronic Science, Hokkaido University
Date	1999/10/29
Paper #	SCE99-21
Volume (vol)	vol.99
Number (no)	408
Page	pp.pp.-
#Pages	6
Date of Issue