Presentation 2000/2/9
Voltage gain of Si single-electron transistor and analysis of performance of nMOS-type inverter with resistive load
Liu K-T, A. Fujiwara, Y. Takahashi, K. Murase, Y. Horikoshi,
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Abstract(in English) Voltage gain is one of the most fundamental parameters of single-electron transistors(SETs)for their application to circuits.In general, due to the device structure of the SET, it is difficult to achieve high voltage gain which is dominated by the ratio of the gate capacitance to the drain capacitance.In this paper, in order to attain a guiding principle for the improvement of voltage gain, we fabricate SETs by pattern-dependent oxidation(PADOX)method and systematically investigate the relation between the voltage gain and the structural parameters of Si-SETs such as Si wire length and gate oxide thickness.Moreover, we simulate the operation of the nMOS-type inverter with resistive load, based on measured IV data of Si-SETs.We analyze voltage gain, response time, power consumption and logic swing voltage;we discuss their correlation.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) SET / voltage gain / PADOX / response time / power consumption / logic swing voltage
Paper # ED99-297,SDM99-190
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Committee ED
Conference Date 2000/2/9(1days)
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Language JPN
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Title (in English) Voltage gain of Si single-electron transistor and analysis of performance of nMOS-type inverter with resistive load
Sub Title (in English)
Keyword(1) SET
Keyword(2) voltage gain
Keyword(3) PADOX
Keyword(4) response time
Keyword(5) power consumption
Keyword(6) logic swing voltage
1st Author's Name Liu K-T
1st Author's Affiliation Electrial Engineering, Graduate School of Science and Engineering, Waseda University()
2nd Author's Name A. Fujiwara
2nd Author's Affiliation NTT Basic Research Labs.
3rd Author's Name Y. Takahashi
3rd Author's Affiliation NTT Basic Research Labs.
4th Author's Name K. Murase
4th Author's Affiliation NTT Basic Research Labs.
5th Author's Name Y. Horikoshi
5th Author's Affiliation Electrial Engineering, Graduate School of Science and Engineering, Waseda University
Date 2000/2/9
Paper # ED99-297,SDM99-190
Volume (vol) vol.99
Number (no) 615
Page pp.pp.-
#Pages 8
Date of Issue