Presentation 2005-07-14
Test Flow Path Set Selection for Accurate QoS Degradation Locating from End-to-End Flow Quality Information
Yohei Hasegawa, Masayoshi KOBAYASHI, Tutomu Murase,
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Abstract(in English) We have proposed a method which locates the QoS degradation by using end-to-end per flow quality information. The method makes use of the test-flows to maintain the accuracy of locating when the number of flows generated by the actual communications are not sufficient. Thus, it cannot achieve sufficient accuracy in the case that a small number of hosts are capable to generate test flows, or their locations are restricted, because of the difficulty to generate test flows passing through the desirable paths. Moreover, even if the test flow can always be generated for any path, we need to select a limited number of test flows not to burden the networks while keeping the accuracy of locating. In this paper, we propose to use test flow which has round trip path like ping so that plenty of paths are available. And we propose heuristic method for selecting test flow, which is aimed to reduce search cost of test flow. Simulation results show that the proposed method improved accuracy of the estimation by ten times greater than the original method. The proposed method also reduced cost of calculating test flow by 90%.
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Keyword(in English) network monitoring / QoS measurement / active measurement / network tomography
Paper # CQ2005-17
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Committee CQ
Conference Date 2005/7/7(1days)
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Paper Information
Registration To Communication Quality (CQ)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Test Flow Path Set Selection for Accurate QoS Degradation Locating from End-to-End Flow Quality Information
Sub Title (in English)
Keyword(1) network monitoring
Keyword(2) QoS measurement
Keyword(3) active measurement
Keyword(4) network tomography
1st Author's Name Yohei Hasegawa
1st Author's Affiliation System Platforms Research Laboratories, NEC Corporation()
2nd Author's Name Masayoshi KOBAYASHI
2nd Author's Affiliation System Platforms Research Laboratories, NEC Corporation
3rd Author's Name Tutomu Murase
3rd Author's Affiliation System Platforms Research Laboratories, NEC Corporation
Date 2005-07-14
Paper # CQ2005-17
Volume (vol) vol.105
Number (no) 179
Page pp.pp.-
#Pages 6
Date of Issue