Presentation | 2002/7/12 An extension of traitor tracing scheme using Weil-pairing on elliptic curves Shigeo MITSUNARI, Hideyuki WATANABE, Maki YOSHIDA, Ryuichi SAKAI, Masao KASAHARA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | In the previous traitor tracing schemes, there exists an upper bound on the number of traitors who attack the schemes for certifying the security. We proposed one resolution of the problem using Weil-pairing on the elliptic curves. In this paper, we extend the scheme, yielding an asymmetric self-enforcement and revocation scheme. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | traitor tracing / asymmetric / self-enforcement / revocation / collusion attack free / Weil-pairing |
Paper # | ISEC2002-50 |
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Conference Information | |
Committee | ISEC |
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Conference Date | 2002/7/12(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Information Security (ISEC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | An extension of traitor tracing scheme using Weil-pairing on elliptic curves |
Sub Title (in English) | |
Keyword(1) | traitor tracing |
Keyword(2) | asymmetric |
Keyword(3) | self-enforcement |
Keyword(4) | revocation |
Keyword(5) | collusion attack free |
Keyword(6) | Weil-pairing |
1st Author's Name | Shigeo MITSUNARI |
1st Author's Affiliation | Pixela Co., Ltd.() |
2nd Author's Name | Hideyuki WATANABE |
2nd Author's Affiliation | Ibis Inc. |
3rd Author's Name | Maki YOSHIDA |
3rd Author's Affiliation | Dept. of Multimedia Engineering, Graduate School of Information Science and Technology, Osaka University |
4th Author's Name | Ryuichi SAKAI |
4th Author's Affiliation | Faculty of Engineering, Osaka Electro-Communication University |
5th Author's Name | Masao KASAHARA |
5th Author's Affiliation | Faculty of Informatics, Osaka Gakuin University |
Date | 2002/7/12 |
Paper # | ISEC2002-50 |
Volume (vol) | vol.102 |
Number (no) | 212 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |