Presentation 2002/7/12
An extension of traitor tracing scheme using Weil-pairing on elliptic curves
Shigeo MITSUNARI, Hideyuki WATANABE, Maki YOSHIDA, Ryuichi SAKAI, Masao KASAHARA,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) In the previous traitor tracing schemes, there exists an upper bound on the number of traitors who attack the schemes for certifying the security. We proposed one resolution of the problem using Weil-pairing on the elliptic curves. In this paper, we extend the scheme, yielding an asymmetric self-enforcement and revocation scheme.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) traitor tracing / asymmetric / self-enforcement / revocation / collusion attack free / Weil-pairing
Paper # ISEC2002-50
Date of Issue

Conference Information
Committee ISEC
Conference Date 2002/7/12(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Information Security (ISEC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) An extension of traitor tracing scheme using Weil-pairing on elliptic curves
Sub Title (in English)
Keyword(1) traitor tracing
Keyword(2) asymmetric
Keyword(3) self-enforcement
Keyword(4) revocation
Keyword(5) collusion attack free
Keyword(6) Weil-pairing
1st Author's Name Shigeo MITSUNARI
1st Author's Affiliation Pixela Co., Ltd.()
2nd Author's Name Hideyuki WATANABE
2nd Author's Affiliation Ibis Inc.
3rd Author's Name Maki YOSHIDA
3rd Author's Affiliation Dept. of Multimedia Engineering, Graduate School of Information Science and Technology, Osaka University
4th Author's Name Ryuichi SAKAI
4th Author's Affiliation Faculty of Engineering, Osaka Electro-Communication University
5th Author's Name Masao KASAHARA
5th Author's Affiliation Faculty of Informatics, Osaka Gakuin University
Date 2002/7/12
Paper # ISEC2002-50
Volume (vol) vol.102
Number (no) 212
Page pp.pp.-
#Pages 6
Date of Issue