Presentation | 2005-09-15 Modeling the Effective Capacitance of Interconnect Loads for Predicting CMOS Gate Slew Zhangcai HUANG, Atsushi KUROKAWA, Yasuaki INOUE, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | In deep submicron designs, predicting gate slews and delays for interconnect loads is vitally important for Static Timing Analysis (STA). The effective capacitance Ceff concept is usually used to calculate the gate delay of the interconnect loads. Many Ceff algorithms have been proposed to compute gate delay of interconnect loads. However, less work has been done to develop a Ceff algorithm which can accurately predict gate slew. In this paper, we propose a novel method for calculating Ceff of interconnect load for gate slew. The simulation results demonstrate a significant improvement in accuracy. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Static Timing Analysis / Gate Slew / Effective Capacitance / Interconnect Loads |
Paper # | CAS2005-31,NLP2005-44 |
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Committee | NLP |
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Conference Date | 2005/9/8(1days) |
Place (in Japanese) | (See Japanese page) |
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Registration To | Nonlinear Problems (NLP) |
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Language | ENG |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Modeling the Effective Capacitance of Interconnect Loads for Predicting CMOS Gate Slew |
Sub Title (in English) | |
Keyword(1) | Static Timing Analysis |
Keyword(2) | Gate Slew |
Keyword(3) | Effective Capacitance |
Keyword(4) | Interconnect Loads |
1st Author's Name | Zhangcai HUANG |
1st Author's Affiliation | The Graduate School of Information, Production and Systems, Waseda University() |
2nd Author's Name | Atsushi KUROKAWA |
2nd Author's Affiliation | The Semiconductor Technology Academic Research Center (STAC) |
3rd Author's Name | Yasuaki INOUE |
3rd Author's Affiliation | The Graduate School of Information, Production and Systems, Waseda University |
Date | 2005-09-15 |
Paper # | CAS2005-31,NLP2005-44 |
Volume (vol) | vol.105 |
Number (no) | 276 |
Page | pp.pp.- |
#Pages | 6 |
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