Presentation 2005/7/29
Behavior Analysis for Delinquent Loads
Hideki MIWA, Yasuhiro DOUGO, Koji INOUE, Kazuaki MURAKAMI,
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Abstract(in English) In recent years, the performance of microprocessors has been improved extremely. On the other hand, DRAMs, commonly used as the main memory, is about 100 times as slow as microprocessors. In this situation, DRAMs suppress the performance of microprocessors. This problem is commonly called Memory Wall Problem. For the performance improvement of computer systems, it is very important to solve this problem. Currently, the authors are developing cache miss penalty reduction techniques focused on the delinquent loads which cause the cache misses frequently. Such load instructions are responsible for 90% of all the cache misses, and deteriorate the performance. In this paper, to reveal the cause of cache misses, the authors investigate the memory access patterns for several benchmark programs. The results show that almost all of the data which cause cache misses had been written to memory system by store instructions.
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Keyword(in English) cache memory / memory wall problem / cache miss penalty reduction / delinquent load instructions
Paper # CPSY2005-22
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Committee CPSY
Conference Date 2005/7/29(1days)
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Registration To Computer Systems (CPSY)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Behavior Analysis for Delinquent Loads
Sub Title (in English)
Keyword(1) cache memory
Keyword(2) memory wall problem
Keyword(3) cache miss penalty reduction
Keyword(4) delinquent load instructions
1st Author's Name Hideki MIWA
1st Author's Affiliation Dept. of Informatics, Kyushu University()
2nd Author's Name Yasuhiro DOUGO
2nd Author's Affiliation Dept. of Electronics Engineering, Fukuoka University
3rd Author's Name Koji INOUE
3rd Author's Affiliation Dept. of Informatics, Kyushu University
4th Author's Name Kazuaki MURAKAMI
4th Author's Affiliation Dept. of Informatics, Kyushu University
Date 2005/7/29
Paper # CPSY2005-22
Volume (vol) vol.105
Number (no) 226
Page pp.pp.-
#Pages 6
Date of Issue