| Presentation | 2005-09-08 A study on ISN for measuring conductive disturbance at communication port of ITE Hiroshi YAMANE, Kunihiro OSABE, Jiro KAWANO, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | As disturbance emitted from information technology equipment (ITE), there are radiated disturbance from apparatus, conductive disturbance at mains port and conductive disturbance at communication port, and each measuring method is specified in CISPR Pub.22. About the impedance stabilizing network (ISN) for communication port conductive disturbance measurement, the longitudinal conversion loss (LCL) requirements are changed in the 4th edition of issue in April, 2003. In this report, the result examined about the composition of ISN which satisfies the new requirement of LCL is described. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Conductive disturbance / Communication port / ISN / LCL / ITE |
| Paper # | EMCJ2005-63 |
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| Conference Information | |
| Committee | EMCJ |
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| Conference Date | 2005/9/1(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Vice Chair | |
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| Paper Information | |
| Registration To | Electromagnetic Compatibility (EMCJ) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A study on ISN for measuring conductive disturbance at communication port of ITE |
| Sub Title (in English) | |
| Keyword(1) | Conductive disturbance |
| Keyword(2) | Communication port |
| Keyword(3) | ISN |
| Keyword(4) | LCL |
| Keyword(5) | ITE |
| 1st Author's Name | Hiroshi YAMANE |
| 1st Author's Affiliation | NTT Energy and Environment Systems Laboratories() |
| 2nd Author's Name | Kunihiro OSABE |
| 2nd Author's Affiliation | Voluntary EMC Laboratory Accreditation Center Inc. |
| 3rd Author's Name | Jiro KAWANO |
| 3rd Author's Affiliation | Voluntary Control Council for Interference by Information Technology Equipment |
| Date | 2005-09-08 |
| Paper # | EMCJ2005-63 |
| Volume (vol) | vol.105 |
| Number (no) | 263 |
| Page | pp.pp.- |
| #Pages | 5 |
| Date of Issue | |