| Presentation | 2005-09-08 Diagnostic Test Compaction for Combinational and Sequential Circuits Yoshinobu HIGAMI, KEWAL K. SALUJA, Hiroshi TAKAHASHI, Shinya KOBAYASHI, Yuzo TAKAMATSU, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Recently, it is getting important to reduce the cost of test and fault diagnosis. Since the cost of test and fault diagnosis depends on the number of test vectors, test vectors must be compacted. This paper presents a method for compacting diagnostic test sets or test sequences for combinational and sequential circuits. The proposed methods reduce the number of test vectors while maintaining the original diagnostic capability. In order to compact diagnostic test vectors, we must take care of a large number of fault pairs, which is the square number of faults. The proposed methods introduce heuristics to reduce the number of fault pairs that are handled at one time. The effectiveness of the proposed methods are shown by experimental results for ISCAS benchmark circuits. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | fault diagnosis / test compaction / combinational circuit / sequential circuit |
| Paper # | CPM2005-89,ICD2005-99 |
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| Conference Information | |
| Committee | CPM |
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| Conference Date | 2005/9/1(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Paper Information | |
| Registration To | Component Parts and Materials (CPM) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Diagnostic Test Compaction for Combinational and Sequential Circuits |
| Sub Title (in English) | |
| Keyword(1) | fault diagnosis |
| Keyword(2) | test compaction |
| Keyword(3) | combinational circuit |
| Keyword(4) | sequential circuit |
| 1st Author's Name | Yoshinobu HIGAMI |
| 1st Author's Affiliation | Department of Computer Science, Ehime University() |
| 2nd Author's Name | KEWAL K. SALUJA |
| 2nd Author's Affiliation | Department of Electrical and Computer Engineering, University of Wisconsin-Madison |
| 3rd Author's Name | Hiroshi TAKAHASHI |
| 3rd Author's Affiliation | Department of Computer Science, Ehime University |
| 4th Author's Name | Shinya KOBAYASHI |
| 4th Author's Affiliation | Department of Computer Science, Ehime University |
| 5th Author's Name | Yuzo TAKAMATSU |
| 5th Author's Affiliation | Department of Computer Science, Ehime University |
| Date | 2005-09-08 |
| Paper # | CPM2005-89,ICD2005-99 |
| Volume (vol) | vol.105 |
| Number (no) | 265 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |