Presentation 2002/3/13
Measurement of ESD Trouthful Withstand Voltage of Device
Norio Murasaki, Yasuaki Hagimoto,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) In order to invent a method of measurement of ESD truthful withstand voltage based on solid ground, the correlation between test generator input capacity and ESD withstand Voltage of DUT was experimented by MM method with SOP 16 pin. Experiment showes that withstand truthful voltage is a product of input voltage by transfer function of test equipment. If withstand truthful voltage of all devices are higher than ESD voltage in the environment, ESD hazards does not generate in it. The product of input voltage by transfer function of test equipment is the first consideration of ESD hazards control, though transfer function is not open to the public.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) truthful withstand voltage / ESD test equipment / transfer function / input voltage
Paper # SSS2001-33
Date of Issue

Conference Information
Committee SSS
Conference Date 2002/3/13(1days)
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Paper Information
Registration To Safety (SSS)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Measurement of ESD Trouthful Withstand Voltage of Device
Sub Title (in English)
Keyword(1) truthful withstand voltage
Keyword(2) ESD test equipment
Keyword(3) transfer function
Keyword(4) input voltage
1st Author's Name Norio Murasaki
1st Author's Affiliation Tokyo University of Agriculture and Technology()
2nd Author's Name Yasuaki Hagimoto
2nd Author's Affiliation National Institute of Police Science
Date 2002/3/13
Paper # SSS2001-33
Volume (vol) vol.101
Number (no) 739
Page pp.pp.-
#Pages 8
Date of Issue