Presentation 2003/4/18
Degradation analysis of a semiconductor optical amplifier (SOA)
Hiroyuki KAMIOKA, Tatsuya TAKESHITA, Katsuaki MAGARI, Toshio ITO, Yuichi TOHMORI,
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Abstract(in English) To evaluate the reliability of a semiconductor optical amplifier (SOA), we carried out long-term aging tests. It is suggested that the degradation process of the SOA is similar to that of the BH laser because the degradation behavior is similar to that of the BH laser, and because the activation energy of the SOA is close to that of the BH laser. The lifetime is estimated to be over 10^5 hours at 25℃ and 100 mA based on a criterion of 1 dB decrease in gain. The observation of an active layer by the use of optical-beam-induced-currents (OBIC) indicates the degradation at a butt-joint region of the active layer.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Semiconductor optical amplifier / Reliability / activation energy / Degradation analysis / OBIC
Paper # R2003-12,CPM2003-12,OPE2003-12
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Committee R
Conference Date 2003/4/18(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Degradation analysis of a semiconductor optical amplifier (SOA)
Sub Title (in English)
Keyword(1) Semiconductor optical amplifier
Keyword(2) Reliability
Keyword(3) activation energy
Keyword(4) Degradation analysis
Keyword(5) OBIC
1st Author's Name Hiroyuki KAMIOKA
1st Author's Affiliation NTT Photonics Laboratories, NTT cooperation()
2nd Author's Name Tatsuya TAKESHITA
2nd Author's Affiliation NTT Photonics Laboratories, NTT cooperation
3rd Author's Name Katsuaki MAGARI
3rd Author's Affiliation NTT Photonics Laboratories, NTT cooperation
4th Author's Name Toshio ITO
4th Author's Affiliation NTT Photonics Laboratories, NTT cooperation
5th Author's Name Yuichi TOHMORI
5th Author's Affiliation NTT Photonics Laboratories, NTT cooperation
Date 2003/4/18
Paper # R2003-12,CPM2003-12,OPE2003-12
Volume (vol) vol.103
Number (no) 33
Page pp.pp.-
#Pages 4
Date of Issue