Presentation 2003/4/18
Opto-electronic Chip-on-film (OE-COF) Packaging Technology Using Optical Waveguide Films with Low Coefficients of Thermal Expansion
Mitsuo USUI, Shigeki ISHIBASHI, Nobutatsu KOSHOUBU, Suzuko ISHIZAWA, Hirooki HIRATA, Hideyuki TAKAHARA,
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Abstract(in English) OE-COF packaging technology, including flip-chip bonded optical devices and LSIs on the optical waveguide film with impedance-matched electrical lines, was developed for over 10-Gbit/s transceiver modules. Self-aligned, mechanically reliable OE-COF was achieved by developing low-thermal-expansion OE film whose expansion coefficient was 1/6 that of the original OE film. Good optical interconnection characteristics were obtained by reducing of the optical return noise using refractive index matching cement between flip-chip bonded VCSEL and OE film surface. To evaluate the reliability of the Au-Sn solder bump connection, the thermal-shock test of -55℃-+125℃ was carried out. As a result, there was no change in the bonding strength after 1000 cycles, and it was confirmed to have a high thermal shock resistance. Impedance-matched copper co-planer waveguides formed on the surface of the OE film have -3 dB band width of 40GHz or more.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) OE-COF packaging / Au-Sn solder bump / OE film / Fluorinated polyimide
Paper # R2003-8,CPM2003-8,OPE2003-8
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Committee R
Conference Date 2003/4/18(1days)
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Registration To Reliability(R)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Opto-electronic Chip-on-film (OE-COF) Packaging Technology Using Optical Waveguide Films with Low Coefficients of Thermal Expansion
Sub Title (in English)
Keyword(1) OE-COF packaging
Keyword(2) Au-Sn solder bump
Keyword(3) OE film
Keyword(4) Fluorinated polyimide
1st Author's Name Mitsuo USUI
1st Author's Affiliation NTT Microsystem Integration Laboratories()
2nd Author's Name Shigeki ISHIBASHI
2nd Author's Affiliation NTT Access Network Service Systems Laboratories
3rd Author's Name Nobutatsu KOSHOUBU
3rd Author's Affiliation NTT Microsystem Integration Laboratories
4th Author's Name Suzuko ISHIZAWA
4th Author's Affiliation NTT Microsystem Integration Laboratories
5th Author's Name Hirooki HIRATA
5th Author's Affiliation NTT Microsystem Integration Laboratories
6th Author's Name Hideyuki TAKAHARA
6th Author's Affiliation NTT Microsystem Integration Laboratories
Date 2003/4/18
Paper # R2003-8,CPM2003-8,OPE2003-8
Volume (vol) vol.103
Number (no) 33
Page pp.pp.-
#Pages 6
Date of Issue