Presentation | 2005-03-18 Quantity of Information of Recognition : How Many Bits Are Lacking for 100% Recognition? Masakazu IWAMURA, Seiichi UCHIDA, Shinichiro OMACHI, Koichi KISE, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The ultimate dream in pattern recognition is to achieve 100% of recognition rate. However, it is not so easy. In this report, for achieving 100% of recognition rate and 0% of rejection rate, we propose a new framework that the discriminator receives not only a pattern itself but also supplementary information about the class that the pattern belongs to. For printed characters, experiments showed that 4 bits are required in the leave-one-out (L) method and 1 bit is in the resubstitution (R) method. Such kind of quantity of information has different characteristics from recognition rates and ambiguity after recognition. This criterion can be a new criterion of a discriminator. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | discriminator / quantity of information / confusion matrix / supplementary information |
Paper # | TL2004-69,PRMU2004-237 |
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Conference Information | |
Committee | PRMU |
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Conference Date | 2005/3/11(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Pattern Recognition and Media Understanding (PRMU) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Quantity of Information of Recognition : How Many Bits Are Lacking for 100% Recognition? |
Sub Title (in English) | |
Keyword(1) | discriminator |
Keyword(2) | quantity of information |
Keyword(3) | confusion matrix |
Keyword(4) | supplementary information |
1st Author's Name | Masakazu IWAMURA |
1st Author's Affiliation | Graduate School of Engineering, Osaka Prefecture University() |
2nd Author's Name | Seiichi UCHIDA |
2nd Author's Affiliation | Faculty of Information Science and Electrical Engineering, Kyushu University |
3rd Author's Name | Shinichiro OMACHI |
3rd Author's Affiliation | Graduate School of Engineering, Tohoku University |
4th Author's Name | Koichi KISE |
4th Author's Affiliation | Graduate School of Engineering, Osaka Prefecture University |
Date | 2005-03-18 |
Paper # | TL2004-69,PRMU2004-237 |
Volume (vol) | vol.104 |
Number (no) | 742 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |