Presentation 2005-01-27
Femtoseocnd interferometric measurement of nonlinear phase shift in semiconductor nanostructures
Kazuhiko MISAWA, Fumikazu INUZUKA, Roy LANG,
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Abstract(in English) We present simultaneous measurement of femtosecond time-resolved nonlinear phase and amplitude changes around the excitonic resonance of the AlGaAs/GaAs quantum well using polarization-division Sagnac interferometer. The nonlinear complex refractive index of the semiconductor material for all-optical devices is successfully determined from directly measured nonlinear phase and amplitude changes.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) nonlinear phase shift / femtosecond interferometer / nonlinear complex refractive index
Paper # PN2004-86,OFT2004-92,OPE2004-193,LQE2004-140
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Conference Information
Committee LQE
Conference Date 2005/1/20(1days)
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Registration To Lasers and Quantum Electronics (LQE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Femtoseocnd interferometric measurement of nonlinear phase shift in semiconductor nanostructures
Sub Title (in English)
Keyword(1) nonlinear phase shift
Keyword(2) femtosecond interferometer
Keyword(3) nonlinear complex refractive index
1st Author's Name Kazuhiko MISAWA
1st Author's Affiliation Tokyo University of Agriculture and Technology:JST CREST()
2nd Author's Name Fumikazu INUZUKA
2nd Author's Affiliation Tokyo University of Agriculture and Technology:JST CREST
3rd Author's Name Roy LANG
3rd Author's Affiliation Tokyo University of Agriculture and Technology:JST CREST
Date 2005-01-27
Paper # PN2004-86,OFT2004-92,OPE2004-193,LQE2004-140
Volume (vol) vol.104
Number (no) 610
Page pp.pp.-
#Pages 5
Date of Issue