Presentation 2004/10/14
Surface Stoichiometry Control of InN Grown by RF-MBE Using In-situ Spectroscopic Ellipsometry
Masayoshi YOSHITANI, Koichiro AKASAKA, Song-Bek CHE, Xinqiang WANG, Yoshihiro ISHITANI, Akihiko YOSHIKAWA,
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Abstract(in English) In order to obtain a high quality InN film, higher temperature growth is preferable with considering decomposition temperature of InN, which is estimated to be about 600℃. Under this condition, a V/III ratio during the InN growth should be precisely controlled to keep the Stoichiometry condition. In this study, we investigated surface states of InN epitaxial layers by using the in-situ Spectroscopic ellipsometry (SE). Pseudo-dielectric function <ε> strongly depended on surface states and V/III ratios. This real time SE monitoring was very useful to control the surface state and to obtain high quality and thick (over 5 μm) InN crystals.
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Keyword(in English) InN / Spectroscopic ellipsometry / Surface Stoichiometry / RF-MBE
Paper # ED2004-129,CPM2004-103,LQE2004-67
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Committee LQE
Conference Date 2004/10/14(1days)
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Registration To Lasers and Quantum Electronics (LQE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Surface Stoichiometry Control of InN Grown by RF-MBE Using In-situ Spectroscopic Ellipsometry
Sub Title (in English)
Keyword(1) InN
Keyword(2) Spectroscopic ellipsometry
Keyword(3) Surface Stoichiometry
Keyword(4) RF-MBE
1st Author's Name Masayoshi YOSHITANI
1st Author's Affiliation Department of Electronics and Mechanical Engineering, Chiba University()
2nd Author's Name Koichiro AKASAKA
2nd Author's Affiliation Department of Electronics and Mechanical Engineering, Chiba University
3rd Author's Name Song-Bek CHE
3rd Author's Affiliation Department of Electronics and Mechanical Engineering, Chiba University:Chiba University-VBL:InN-Project as a CREST program of JST, Chiba University
4th Author's Name Xinqiang WANG
4th Author's Affiliation Chiba University-VBL:InN-Project as a CREST program of JST, Chiba University
5th Author's Name Yoshihiro ISHITANI
5th Author's Affiliation Department of Electronics and Mechanical Engineering, Chiba University:Chiba University-VBL:InN-Project as a CREST program of JST, Chiba University
6th Author's Name Akihiko YOSHIKAWA
6th Author's Affiliation Department of Electronics and Mechanical Engineering, Chiba University:Chiba University-VBL:InN-Project as a CREST program of JST, Chiba University
Date 2004/10/14
Paper # ED2004-129,CPM2004-103,LQE2004-67
Volume (vol) vol.104
Number (no) 361
Page pp.pp.-
#Pages 4
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