Presentation 2004/10/14
The influence of low temperature growth of GaN on Si(111) substrates
Tokuo YODO, Takaaki FUKUYAMA, Hiroshi FUCHIGAMI,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) We grew GaN films on Si(111) substrates by ECR-plasma assisted MBE and investigated the optimum low temperature growth process of GaN. We found that RCA method was superior to lshizaka method as chemical etching of Si substrate before growth. AlN buffer layer grown at temperatures higher than 500℃ improved the crystalline quality of GaN films. The strong 391 nm-nitrogen plasma emission intensity also improved it greatly for low temperature growth process. The control of this 391 nm-nitrogen plasma emission intensity and the increase of V/III mole ratio during growth are key factors for low temperature growth process.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) GaN / ECR-plasma assisted MBE / low temperature growthprocess / Si(111) substrate / AlN buffer layer
Paper # ED2004-118,CPM2004-92,LQE2004-56
Date of Issue

Conference Information
Committee LQE
Conference Date 2004/10/14(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Lasers and Quantum Electronics (LQE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) The influence of low temperature growth of GaN on Si(111) substrates
Sub Title (in English)
Keyword(1) GaN
Keyword(2) ECR-plasma assisted MBE
Keyword(3) low temperature growthprocess
Keyword(4) Si(111) substrate
Keyword(5) AlN buffer layer
1st Author's Name Tokuo YODO
1st Author's Affiliation Electronics, Information and Communication Engineering, Osaka Institute of Technology()
2nd Author's Name Takaaki FUKUYAMA
2nd Author's Affiliation Electronics, Information and Communication Engineering, Osaka Institute of Technology
3rd Author's Name Hiroshi FUCHIGAMI
3rd Author's Affiliation Electronics, Information and Communication Engineering, Osaka Institute of Technology
Date 2004/10/14
Paper # ED2004-118,CPM2004-92,LQE2004-56
Volume (vol) vol.104
Number (no) 361
Page pp.pp.-
#Pages 6
Date of Issue