Presentation 2005-04-22
MEMS片持梁の疲労特性に関する研究 : 実デバイスを用いた加速劣化試験と機械的FIT数の導出(光部品の実装・信頼性, 一般)
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Paper # R2005-6,CPM2005-6,OPE2005-6
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Committee OPE
Conference Date 2005/4/15(1days)
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Registration To Optoelectronics (OPE)
Language JPN
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Date 2005-04-22
Paper # R2005-6,CPM2005-6,OPE2005-6
Volume (vol) vol.105
Number (no) 28
Page pp.pp.-
#Pages 4
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