| Presentation | 2005-04-22 Migration test of flexible substrate Ikuo Yanase, Ryuichi Nakajima, Yasuo imai, Sadao Suganuma, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | |
| Paper # | R2005-5,CPM2005-5,OPE2005-5 |
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| Conference Information | |
| Committee | OPE |
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| Conference Date | 2005/4/15(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Paper Information | |
| Registration To | Optoelectronics (OPE) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Migration test of flexible substrate |
| Sub Title (in English) | |
| Keyword(1) | |
| 1st Author's Name | Ikuo Yanase |
| 1st Author's Affiliation | Oki Engineering Co., Ltd Reliability Engineering Department_1() |
| 2nd Author's Name | Ryuichi Nakajima |
| 2nd Author's Affiliation | Oki Engineering Co., Ltd Reliability Engineering Department_1 |
| 3rd Author's Name | Yasuo imai |
| 3rd Author's Affiliation | Oki Engineering Co., Ltd Reliability Engineering Department_1 |
| 4th Author's Name | Sadao Suganuma |
| 4th Author's Affiliation | Oki Engineering Co., Ltd Reliability Engineering Department_1 |
| Date | 2005-04-22 |
| Paper # | R2005-5,CPM2005-5,OPE2005-5 |
| Volume (vol) | vol.105 |
| Number (no) | 28 |
| Page | pp.pp.- |
| #Pages | 7 |
| Date of Issue | |