Presentation | 2005-04-22 Study of accelerated test methods for Optical components Yuichi AOKI, Yasutoshi NAKAGAWA, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | We performed the HAST for adhesive of optical components to compared with High temperature & High humidity test such as 85C85%. The activation energy was requested by using isolator. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | HAST / High Temperature High Humidity Test / adhesive / Isolator |
Paper # | R2005-4,CPM2005-4,OPE2005-4 |
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Conference Information | |
Committee | OPE |
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Conference Date | 2005/4/15(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
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Paper Information | |
Registration To | Optoelectronics (OPE) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Study of accelerated test methods for Optical components |
Sub Title (in English) | |
Keyword(1) | HAST |
Keyword(2) | High Temperature High Humidity Test |
Keyword(3) | adhesive |
Keyword(4) | Isolator |
1st Author's Name | Yuichi AOKI |
1st Author's Affiliation | ESPEC CORP.() |
2nd Author's Name | Yasutoshi NAKAGAWA |
2nd Author's Affiliation | ESPEC CORP. |
Date | 2005-04-22 |
Paper # | R2005-4,CPM2005-4,OPE2005-4 |
Volume (vol) | vol.105 |
Number (no) | 28 |
Page | pp.pp.- |
#Pages | 4 |
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