Presentation 2005-04-22
Experiments of IEEE802.15.4 ESPARSKey (Encryption Scheme Parasite Array Radiator Secret Key) : RSSI Interleaving Scheme
Tomoyuki AONO, Keisuke HIGUCHI, Makoto TAROMARU, Takashi OHIRA, Hideichi SASAOKA,
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Abstract(in English) A secure communication scheme that uses the random fluctuation of the natural environment of communication channels is studied. We have been developing a novel secret key generation and agreement scheme that uses the fluctuation of channel characteristics with an Espar (Electronically Steerable Parasitic Array Radiator) antenna, which has been studied as a variable directional antenna for consumers. We acquire more randomized and stronger secret keys generated from the interleaved RSSI values in this scheme. As a result of experiments on the prototype system in which the IEEE802.15.4/ZigBee^ chip is mounted, we confirmed that the success probability of the key generation was estimated to be more than 99.99% when 128-bit secret keys are changed every three seconds and that the generated secret keys were sufficiently random to pass the statistical test for random numbers of the FIPS (Federal Information Processing Standards) PUB 140-2.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Espar antenna / channel characteristics / RSSI / key agreement / IEEE802.15.4
Paper # RCS2005-12
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Conference Information
Committee RCS
Conference Date 2005/4/15(1days)
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Paper Information
Registration To Radio Communication Systems (RCS)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Experiments of IEEE802.15.4 ESPARSKey (Encryption Scheme Parasite Array Radiator Secret Key) : RSSI Interleaving Scheme
Sub Title (in English)
Keyword(1) Espar antenna
Keyword(2) channel characteristics
Keyword(3) RSSI
Keyword(4) key agreement
Keyword(5) IEEE802.15.4
1st Author's Name Tomoyuki AONO
1st Author's Affiliation ATR Wave Engineering Research Laboratories()
2nd Author's Name Keisuke HIGUCHI
2nd Author's Affiliation ATR Wave Engineering Research Laboratories
3rd Author's Name Makoto TAROMARU
3rd Author's Affiliation ATR Wave Engineering Research Laboratories
4th Author's Name Takashi OHIRA
4th Author's Affiliation ATR Wave Engineering Research Laboratories
5th Author's Name Hideichi SASAOKA
5th Author's Affiliation Graduate School of Engineering, Doshisha University
Date 2005-04-22
Paper # RCS2005-12
Volume (vol) vol.105
Number (no) 15
Page pp.pp.-
#Pages 6
Date of Issue