Presentation | 2005-01-26 Characteristics of Mobile Radio Rayleigh Fading Simulator Utilizing Pulse Trains Satisfying the WSSUS Condition for Power Kenji ARIMOTO, Hiroshi SUZUKI, Kazuhiko FUKAWA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | This report proposes a new fading model that uses random variables and periodic and deterministic pulse trains. First, it is demonstrated that satisfying the WSSUS condition by the deterministic pulse is hardly feasible. Next, the WSS condition for the power and a model meeting this condition are discussed in detail. This model can simulate not only the standard mobile wireless channel but also the ad hoc environment where both transmitters and receivers move and communicate directly with each other. To clarify the characteristics of the fading and the properties of CIR, computer simulations evaluate the average level crossing rate and average outage duration of both CNR and CIR, and the packet error rate of CIR. Also they demonstrate that these results almost agree with the theoretical ones. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Rayleigh fading / WSSUS condition / ad hoc network / CIR / average lovel crossing rate / average outage duration / packet error rate |
Paper # | CS2004-143,RCS2004-250 |
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Conference Information | |
Committee | RCS |
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Conference Date | 2005/1/19(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Radio Communication Systems (RCS) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Characteristics of Mobile Radio Rayleigh Fading Simulator Utilizing Pulse Trains Satisfying the WSSUS Condition for Power |
Sub Title (in English) | |
Keyword(1) | Rayleigh fading |
Keyword(2) | WSSUS condition |
Keyword(3) | ad hoc network |
Keyword(4) | CIR |
Keyword(5) | average lovel crossing rate |
Keyword(6) | average outage duration |
Keyword(7) | packet error rate |
1st Author's Name | Kenji ARIMOTO |
1st Author's Affiliation | Tokyo Institute of Technology() |
2nd Author's Name | Hiroshi SUZUKI |
2nd Author's Affiliation | Tokyo Institute of Technology |
3rd Author's Name | Kazuhiko FUKAWA |
3rd Author's Affiliation | Tokyo Institute of Technology |
Date | 2005-01-26 |
Paper # | CS2004-143,RCS2004-250 |
Volume (vol) | vol.104 |
Number (no) | 597 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |