Presentation 2005/1/21
Study on protecting layer for ac-PDPs
Takayoshi HIRAKAWA, Heiju UCHIIKE,
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Abstract(in English) Analysis for ion-induced secondary electron emission (γ_i) characteristics has been the only evaluation method for protecting layer for ac-PDPs. If a new evaluation method is constructed in addition to γ_i measurement, we can obtain more detailed information. In the present work we analyzed magnesium oxide thin film by cathodoluminescence and discussed the obtained results for evaluation of protecting layer.
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Keyword(in English) Protecting layer for ac-PDPs / Cathodoluminescence / MgO thin film
Paper # EID2004-67
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Conference Information
Committee EID
Conference Date 2005/1/21(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Study on protecting layer for ac-PDPs
Sub Title (in English)
Keyword(1) Protecting layer for ac-PDPs
Keyword(2) Cathodoluminescence
Keyword(3) MgO thin film
1st Author's Name Takayoshi HIRAKAWA
1st Author's Affiliation Graduate School of Science and Engineering, Saga University()
2nd Author's Name Heiju UCHIIKE
2nd Author's Affiliation Faculty of Electrical and Electronic engineering, Saga University
Date 2005/1/21
Paper # EID2004-67
Volume (vol) vol.104
Number (no) 621
Page pp.pp.-
#Pages 4
Date of Issue