Presentation | 2005/1/21 Study on protecting layer for ac-PDPs Takayoshi HIRAKAWA, Heiju UCHIIKE, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Analysis for ion-induced secondary electron emission (γ_i) characteristics has been the only evaluation method for protecting layer for ac-PDPs. If a new evaluation method is constructed in addition to γ_i measurement, we can obtain more detailed information. In the present work we analyzed magnesium oxide thin film by cathodoluminescence and discussed the obtained results for evaluation of protecting layer. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Protecting layer for ac-PDPs / Cathodoluminescence / MgO thin film |
Paper # | EID2004-67 |
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Conference Information | |
Committee | EID |
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Conference Date | 2005/1/21(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electronic Information Displays (EID) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Study on protecting layer for ac-PDPs |
Sub Title (in English) | |
Keyword(1) | Protecting layer for ac-PDPs |
Keyword(2) | Cathodoluminescence |
Keyword(3) | MgO thin film |
1st Author's Name | Takayoshi HIRAKAWA |
1st Author's Affiliation | Graduate School of Science and Engineering, Saga University() |
2nd Author's Name | Heiju UCHIIKE |
2nd Author's Affiliation | Faculty of Electrical and Electronic engineering, Saga University |
Date | 2005/1/21 |
Paper # | EID2004-67 |
Volume (vol) | vol.104 |
Number (no) | 621 |
Page | pp.pp.- |
#Pages | 4 |
Date of Issue |