| Presentation | 2005-01-28 Development of Multiple Fault Diagnosis Based on Path-Tracing for Logic LSIs Yukihisa Funatsu, Hiroshi Sumitomo, Kazuki Shigeta, Toshio Ishiyama, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | For recent highly integrated and shrunk LSIs, CAD-based fault diagnosis technology which supports physical failure analysis has become more impotant, . Our group has proposed and developed fault diagnosis technique of several types of a single fault (stuck-at, open, and bridging fault). In this paper, we report a fault diagnosis method for multiple faults, The method classifies fault effect propagation paths in a circuit and its results. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | fault diagnosis / logic circuit / multi fault / path trace / sequential circuit |
| Paper # | CPM2004-174,ICD2004-219 |
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| Conference Information | |
| Committee | ICD |
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| Conference Date | 2005/1/21(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Integrated Circuits and Devices (ICD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Development of Multiple Fault Diagnosis Based on Path-Tracing for Logic LSIs |
| Sub Title (in English) | |
| Keyword(1) | fault diagnosis |
| Keyword(2) | logic circuit |
| Keyword(3) | multi fault |
| Keyword(4) | path trace |
| Keyword(5) | sequential circuit |
| 1st Author's Name | Yukihisa Funatsu |
| 1st Author's Affiliation | Test Analysis Technology Development Division, NEC Electronics Corporation() |
| 2nd Author's Name | Hiroshi Sumitomo |
| 2nd Author's Affiliation | Test Analysis Technology Development Division, NEC Electronics Corporation |
| 3rd Author's Name | Kazuki Shigeta |
| 3rd Author's Affiliation | Test Analysis Technology Development Division, NEC Electronics Corporation |
| 4th Author's Name | Toshio Ishiyama |
| 4th Author's Affiliation | Test Analysis Technology Development Division, NEC Electronics Corporation |
| Date | 2005-01-28 |
| Paper # | CPM2004-174,ICD2004-219 |
| Volume (vol) | vol.104 |
| Number (no) | 629 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |