| Presentation | 2005-01-28 Selection of Seeds and Phase Shifters for Scan BIST Masayuki ARAI, Harunobu KUROKAWA, Kenichi ICHINO, Satoshi FUKUMOTO, Kazuhiko IWASAKI, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In this paper, we discuss the application of a seed-selection procedure for LFSR-based BIST to multiple scan chains, combined with a phase shifter. The seed-selection procedure can search the seed of the LFSR that has least test length under the given fault coverage. No hardware overhead is required. By applying this procedure to multiple scan chains, further reduction of testing time can be expected. To avoid linear dependency between scan chains, we combine the procedure with phase shifter. We introduced the procedures for selecting seeds and arrangement of phase shifters under the restriction of limiting additional hardware overheads, and evaluated them in respect to the number of test patterns required to achieve 100% fault coverage. Experimental results shows that that the test length was reduced in comparison with cases in which phase shifters or seed-selection procedures were not applied, under condition where the number of EOR gates in the phase shifter were restricted. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | seed selection procedure / scan BIST / LFSR / phase shifter |
| Paper # | CPM2004-171,ICD2004-216 |
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| Conference Information | |
| Committee | ICD |
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| Conference Date | 2005/1/21(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Paper Information | |
| Registration To | Integrated Circuits and Devices (ICD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Selection of Seeds and Phase Shifters for Scan BIST |
| Sub Title (in English) | |
| Keyword(1) | seed selection procedure |
| Keyword(2) | scan BIST |
| Keyword(3) | LFSR |
| Keyword(4) | phase shifter |
| 1st Author's Name | Masayuki ARAI |
| 1st Author's Affiliation | Graduate School of Engineering, Tokyo Metropolitan University() |
| 2nd Author's Name | Harunobu KUROKAWA |
| 2nd Author's Affiliation | Graduate School of Engineering, Tokyo Metropolitan University |
| 3rd Author's Name | Kenichi ICHINO |
| 3rd Author's Affiliation | Graduate School of Engineering, Tokyo Metropolitan University |
| 4th Author's Name | Satoshi FUKUMOTO |
| 4th Author's Affiliation | Graduate School of Engineering, Tokyo Metropolitan University |
| 5th Author's Name | Kazuhiko IWASAKI |
| 5th Author's Affiliation | Graduate School of Engineering, Tokyo Metropolitan University |
| Date | 2005-01-28 |
| Paper # | CPM2004-171,ICD2004-216 |
| Volume (vol) | vol.104 |
| Number (no) | 629 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |