| Presentation | 2005-01-28 LSI fault diagnosis by using functional test result and netlist extracted from CAD layout data Katsuyoshi MIURA, Koji NAKAMAE, Hiromu FUJIOKA, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | An LSI fault localization method that utilizes output vectors from external test equipment such as the LSI tester and a netlist extracted from the CAD layout data is proposed. An obtained fault-candidate list is used in further fault localization process by internal test equipment such as the electron beam (EB) tester, the laser voltage prober (LVP), and the time resolved emission microscope. Our method requires no design netlist nor generation of test vectors for fault diagnosis. Therefore, it can be easily used at a fault diagnostic division in semiconductor manufacturers. Our method is applied to ISCAS'85 benchmark circuits to show its validity. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | fault diagnosis / LSI tester / EB tester / LVP / time resolved emission microscope / CAD layout |
| Paper # | CPM2004-170,ICD2004-215 |
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| Conference Information | |
| Committee | ICD |
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| Conference Date | 2005/1/21(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
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| Paper Information | |
| Registration To | Integrated Circuits and Devices (ICD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | LSI fault diagnosis by using functional test result and netlist extracted from CAD layout data |
| Sub Title (in English) | |
| Keyword(1) | fault diagnosis |
| Keyword(2) | LSI tester |
| Keyword(3) | EB tester |
| Keyword(4) | LVP |
| Keyword(5) | time resolved emission microscope |
| Keyword(6) | CAD layout |
| 1st Author's Name | Katsuyoshi MIURA |
| 1st Author's Affiliation | Dept. Information Systems Eng., Graduate School of Information Science and Technology, Osaka University() |
| 2nd Author's Name | Koji NAKAMAE |
| 2nd Author's Affiliation | Dept. Information Systems Eng., Graduate School of Information Science and Technology, Osaka University |
| 3rd Author's Name | Hiromu FUJIOKA |
| 3rd Author's Affiliation | Dept. Information Systems Eng., Graduate School of Information Science and Technology, Osaka University |
| Date | 2005-01-28 |
| Paper # | CPM2004-170,ICD2004-215 |
| Volume (vol) | vol.104 |
| Number (no) | 629 |
| Page | pp.pp.- |
| #Pages | 5 |
| Date of Issue | |