Presentation 2005-01-28
A Decompressor with Buffer for Test Compression/Decompression
Michihiro SHINTANI, Masakuni OCHI, Hideyuki ICHIHARA, Tomoo INOUE,
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Abstract(in English) Test compression/decompression scheme using variable-length coding, e.g., Huffman coding, is effective in reducing the test application time and the size of the storage on an LSI tester. In this paper, we propose a model of a decompressor with a buffer for variable-length coding and discuss its property. The embedded buffer allows the decompressor to operate at any input and output clock frequency without a synchronizing mechanism between an ATE and the decompressor. Moreover, we propose a method for reducing the buffer size in the decompressor. Since the buffer size depends on the input order of test vectors, test vector reordering can reduce the buffer size. The proposed algorithm is based on fluctuations in buffered data for each test vector. Experimental results show a case where the ordering algorithm can reduce the size of the buffer by 97%.
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Keyword(in English) Test compression / Huffman coding / embedded decompressor / buffer / test vector / and ordering
Paper # CPM2004-168,ICD2004-213
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Conference Date 2005/1/21(1days)
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Registration To Integrated Circuits and Devices (ICD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Decompressor with Buffer for Test Compression/Decompression
Sub Title (in English)
Keyword(1) Test compression
Keyword(2) Huffman coding
Keyword(3) embedded decompressor
Keyword(4) buffer
Keyword(5) test vector
Keyword(6) and ordering
1st Author's Name Michihiro SHINTANI
1st Author's Affiliation Graduate School of Information Sciences, Hiroshima City University Hiroshima()
2nd Author's Name Masakuni OCHI
2nd Author's Affiliation Faculty of Information Sciences, Hiroshima City University Hiroshima
3rd Author's Name Hideyuki ICHIHARA
3rd Author's Affiliation Faculty of Information Sciences, Hiroshima City University Hiroshima
4th Author's Name Tomoo INOUE
4th Author's Affiliation Faculty of Information Sciences, Hiroshima City University Hiroshima
Date 2005-01-28
Paper # CPM2004-168,ICD2004-213
Volume (vol) vol.104
Number (no) 629
Page pp.pp.-
#Pages 6
Date of Issue