Presentation 2005-01-28
Investigation of diagnostic methods for analog circuits
Norio KUJI,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) A novel diagnostic method has been proposed for parameter faults in analog circuits. In the proposed method, candidates of parameter faults are extracted by solving voltage circuit equations, assuming that only a few patameters are faulty from a viewpoint of probability, and that devices under test (DUT) have a few testing pads for probing. The extracted parameters are ranked according to nearness to the observed electrical responses of DUT. Furthermore, a optimum test-point-selection method has also been discussed, which evaluates diagostic efficiency at each circuit node based on testability measure. The proposed method has been applied to fault diagnosis of an operational amplifier, and its effectiveness has been verified. Since the method enables us to diagnose analog circuits without any knowledge about design, it will greatly contribute to efficient fault diagnosis of mixed-signal LSIs.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Analog circuits / fault diagnosis / paramater optimization / tesing pads / mixed-signal LSI
Paper # CPM2004-165,ICD2004-210
Date of Issue

Conference Information
Committee ICD
Conference Date 2005/1/21(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Vice Chair

Paper Information
Registration To Integrated Circuits and Devices (ICD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Investigation of diagnostic methods for analog circuits
Sub Title (in English)
Keyword(1) Analog circuits
Keyword(2) fault diagnosis
Keyword(3) paramater optimization
Keyword(4) tesing pads
Keyword(5) mixed-signal LSI
1st Author's Name Norio KUJI
1st Author's Affiliation Department of Electrical Engeneering, Hachinohe National College of Technology()
Date 2005-01-28
Paper # CPM2004-165,ICD2004-210
Volume (vol) vol.104
Number (no) 629
Page pp.pp.-
#Pages 6
Date of Issue