| Presentation | 2005-01-28 Investigation of diagnostic methods for analog circuits Norio KUJI, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | A novel diagnostic method has been proposed for parameter faults in analog circuits. In the proposed method, candidates of parameter faults are extracted by solving voltage circuit equations, assuming that only a few patameters are faulty from a viewpoint of probability, and that devices under test (DUT) have a few testing pads for probing. The extracted parameters are ranked according to nearness to the observed electrical responses of DUT. Furthermore, a optimum test-point-selection method has also been discussed, which evaluates diagostic efficiency at each circuit node based on testability measure. The proposed method has been applied to fault diagnosis of an operational amplifier, and its effectiveness has been verified. Since the method enables us to diagnose analog circuits without any knowledge about design, it will greatly contribute to efficient fault diagnosis of mixed-signal LSIs. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Analog circuits / fault diagnosis / paramater optimization / tesing pads / mixed-signal LSI |
| Paper # | CPM2004-165,ICD2004-210 |
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| Conference Information | |
| Committee | ICD |
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| Conference Date | 2005/1/21(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Integrated Circuits and Devices (ICD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Investigation of diagnostic methods for analog circuits |
| Sub Title (in English) | |
| Keyword(1) | Analog circuits |
| Keyword(2) | fault diagnosis |
| Keyword(3) | paramater optimization |
| Keyword(4) | tesing pads |
| Keyword(5) | mixed-signal LSI |
| 1st Author's Name | Norio KUJI |
| 1st Author's Affiliation | Department of Electrical Engeneering, Hachinohe National College of Technology() |
| Date | 2005-01-28 |
| Paper # | CPM2004-165,ICD2004-210 |
| Volume (vol) | vol.104 |
| Number (no) | 629 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |