| Presentation | 2004/11/25 Test compression for scan circuits using scan polarity adjustment and pinpoint test relaxation Yasumi DOI, Seiji KAJIHARA, LI Lei /, Krishnendu CHAKRABARTY, |
|---|---|
| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | This paper presents a test compression method that effectively derives the capability of a run-length based encoding. The method is based on scan polarity adjustment and pinpoint test relaxation. Given a test set for a full scan circuit, scan polarity adjustment selectively flips values of some scan sells in test patterns. It can be realized by changing connections between two scan cells such that the inverted output of a scan cell Q^^- is connected to the next scan cell. Pinpoint test relaxation flips some specified Is in the test patterns to Os. Both techniques are applied with referring to the gain-penalty table to determine scan cells or bits to be flipped. Experimental results for ISCAS'89 benchmark circuits show, that the proposed method could reduce test data volume by 36%, and could reduce switching activities (i.e. test power) during scan testing too. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | run-length codes / test relaxation / gated scan chain |
| Paper # | VLD2004-78,ICD2004-164,DC2004-64 |
| Date of Issue |
| Conference Information | |
| Committee | ICD |
|---|---|
| Conference Date | 2004/11/25(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Integrated Circuits and Devices (ICD) |
|---|---|
| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Test compression for scan circuits using scan polarity adjustment and pinpoint test relaxation |
| Sub Title (in English) | |
| Keyword(1) | run-length codes |
| Keyword(2) | test relaxation |
| Keyword(3) | gated scan chain |
| 1st Author's Name | Yasumi DOI |
| 1st Author's Affiliation | Kyushu Institute of Technology() |
| 2nd Author's Name | Seiji KAJIHARA |
| 2nd Author's Affiliation | Kyushu Institute of Technology |
| 3rd Author's Name | LI Lei / |
| 3rd Author's Affiliation | Kyushu Institute of Technology |
| 4th Author's Name | Krishnendu CHAKRABARTY |
| 4th Author's Affiliation | Duke University |
| Date | 2004/11/25 |
| Paper # | VLD2004-78,ICD2004-164,DC2004-64 |
| Volume (vol) | vol.104 |
| Number (no) | 480 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |